Motorola Corporation

Seshagiri Prasad Kalluri

Rene M Delgado

James B Eifert

Method and apparatus for reducing the time required to test an integrated circuit (10) using slew rate control. Using a very slow slew rate during normal operation may reduce electromagnetic interference, while using a faster slew rate during testing may reduce the test costs. In one embodiment, terminal control circuitry (40) includes a fast test control bit (50) to select a slow slew rate during normal operation, to select a faster slew rate during functional testing, and to optionally select a variety of slew rates during a special test to more fully characterize the behavior of integrated circuit (10). In one embodiment, each pre-driver circuit (80, 81) includes a low resistance device (61, 63) which may be selectively enabled or disabled to join with capacitors (66, 67) in output driver (82) to affect the slew rate of the signal driven as an output by integrated circuit terminal (83).

Method and apparatus for reducing the time required to test an

Method and apparatus for selectively enabling a pull device coupled to a multiplexed terminal connector based on the function of the terminal connector. When the terminal functions as a general purpose input/output (GPIO), the pull device is enabled on reset or on setting a control bit. For operation as a data port, the pull device is disabled, and on reset the pull device is enabled only after any pending data transaction has completed. Upon completion of the reset period the pull device is again disabled for data port operation. In one embodiment, a terminal has a first interruptible function and a second uninterruptible function. The terminal is coupled to a pull device and control logic. If the second function is active, the control logic enables the pull device with a time delay sufficient that the second function is completed prior to the enabling of the pull device.

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Austin, TX, United States of America

Seshagiri Prasad Kalluri