University of Missouri

Sergiy Kharkivskiy

Reza Zoughi

Mohamed Ahmed AbouKhousa

Mohammad Tayeb Ahmad Ghasr

David Johannes Pommerenke

Vivian Stephen

Analyzing a device under test ('DUT') at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.

High frequency analysis of a device under test

A sensor array having a plurality of modulated slots for microwave and/or millimeter wave imaging. The locations of the slots in the array define a spatial domain away from an object for detecting an electric field from the object. Each of the slots outputs a signal representative of the measured field and the location of the slot. A processor decodes the signals and generates an image of the object.

Microwave and millimeter wave imaging system

A method for detecting an anomaly in a composite material comprising directing two transmitted electromagnetic wave signals orthogonally polarized with respect to each other from a probe to the composite material, wherein the probe and composite material are positioned for near-field evaluation of the probe. A related apparatus comprising an open-ended square waveguide probe.

Non-destructive testing of physical characteristics of composite structures

An apparatus for inspecting a sample for defects includes a signal generator for generating a signal and a device for splitting the signal into two separate signals which have substantially equal phase and magnitude. A sensor radiates the two signals on the sample and receives the two signals reflected from the sample. A device is provided for determining a difference between the two signals reflected from the sample without unwanted influence of variations of distance between the sensor and sample, and reflections from nearby sample edges and boundaries. A defect is determined to exist when a difference is found between the two reflected signals.

Growing community of inventors

Rolla, MO, United States of America

Sergiy Kharkivskiy