Stmicroelectronics S.r.l.

Stmicroelectronics Application Gmbh

Sgs-thomson Microelectronics S.r.l.

Stmicroelectronics (grenoble 2) Sas

Stmicroelectronics (rousset) Sas

Sergio Lecce

Giovanni Luca Torrisi

Manuel Gaertner

Vanni Poletto

Domenico Massimo Porto

Giorgio Rossi

Antonio Davide Leone

Riccardo Miglierina

Davide Luigi Brambilla

Daniela Nebuloni

Patrizia Milazzo

Valerio Bendotti

Gilles Troussel

Carmelo Burgio

Orazio Pennisi

Mauro Merlo

Franco Cocetta

Vittorio D'Angelo

Salvatore Cannavacciuolo

Walter Girardi

Massimo Grasso

Maurizio Rossi

Luigi Gervasi

An integrated circuit with a hot-plug protection circuit includes input pins and an output pin. The input pins are electrically coupled to a common node in the hot-plug protection circuit via respective electrical connections. The integrated circuit includes clamping circuitry coupled between the common node and the output pin, the clamping circuitry activatable as a result of a voltage spike applied across the clamping circuitry. The plurality of electrical connections and the clamping circuitry provide respective current discharge paths between the input pins in the input pins and the output pin, the respective current discharge paths configured to become conductive as a result of a voltage spike applied to any of the input pins in the plurality of input pins being transferred to the common node via the respective electrical connection in the plurality of electrical connections electrically coupling said any of said input pins to the common node.

Circuit with hot-plug protection, corresponding electronic device, vehicle and method

An input signal arranged in frames is received. The frames include a cyclic redundancy check (CRC) field including a number of bits having bit edges. A timing signal is generated to include adjustable duration waveforms at one of a first duration value and a second duration value. A CRC check determines the occurrence, over the duration, of a number of waveforms of the timing signal having their duration adjusted to one of the first duration value and the second duration value which corresponds to the number of bits. A check signal is produced having a pass/fail value. If pass, the duration of the waveforms in the timing signal is maintained adjusted to the one of the first duration value and the second duration value. If fail, the duration of the waveforms in the timing signal is re-adjusted to the other of the first duration value and the second duration value.

Clock recovery method, corresponding circuit and system

A circuit includes a switching circuit including a first switch and a second switch. A current sensing circuit is coupled to the switching circuit to sense a first current through the first switch and to generate a first sensed current signal based on the sensed first current, and configured to sense a second current through the second switch and to generate a second sensed current signal based on the sensed second current. An output circuit is coupled to the current sensing circuit and is configured to generate a failure signal based on the first sensed current signal and the second sensed current signal.

Device for measuring the current flowing in an inductive load

A circuit for controlling current in an inductive load is provided. The circuit includes a driver circuit for driving a load current in the inductive load. The driver circuit includes a switch, which is switched on to increase the load current and a recirculation diode, which re-circulates the load current when the switch is off. The circuit includes a control module that generates a control signal to switch on and off the switch. The control module includes a PWM current controller comprising a negative feedback closed loop implementing at least a proportional control and an integral control. The PWM current controller receives a target current value and an estimated current flowing in the load during a measurement PWM cycle. The PWM current controller generates the control signal for a control input of the switch based on an error between the target current and the estimated current.

Circuit for controlling the current in inductive loads and control method therefor

An integrated device for driving a lighting load, such as a LED, has a first memory element, configured to store a nominal duty-cycle at a nominal supply voltage. An actual voltage acquisition element is configured to detect an actual supply voltage. A processing unit is coupled to the first memory element and to the actual voltage acquisition element and configured to calculate a voltage compensated duty-cycle. A driver unit is coupled to the processing unit and is configured to be supplied according to the voltage compensated duty-cycle.

Integrated device and method for driving lighting loads with a brightness compensation

A driver circuit includes a supply node, a control node configured to receive a control signal, and an output node. An output transistor is coupled to the output node to provide the CAN bus drive signal via the current path through the output transistor. A current mirror is in a current line from the supply node to the output node through the output transistor. The current line includes an intermediate portion between the current mirror and the output transistor. The current mirror is configured to be switched, as a function of the control signal between a first, dominant mode, with the CAN bus drive signal applied to the output node via the output transistor, and a second, recessive mode, with the output transistor providing a high output impedance at the output node.

Driver circuit, corresponding system and method

A thermal control process for an electronic power device including a multi junction integrated circuit may include defining a first and at least one second groups of junctions, with each group including one first and at least one second junctions, and associating a thermal detector with each group. A first group control may be executed which detects group electric signals representative of the temperature detected by the thermal detectors, processes the group electric signals with reference to a group critical thermal event, identifies a critical group when the corresponding group electric signal detects the critical group thermal event, and generates group deactivating signals suitable for selectively deactivating the first and the at least one second junctions of the identified critical group with respect to the remaining junctions of the integrated circuit.

Thermal control process for a multijunction electronic power device and corresponding electronic power device

A device measures the current in an inductive load using two separate current-measuring paths to detect the current in the inductive load. The inductive load is connected between first and second nodes, and the first node connected to a first voltage. The device includes first and second transistors cascaded together between the first node and a third node that is connected to a second voltage. First and second sense amplifiers measure the current in the inductive load. The first and second sense amplifiers are connected to at least one terminal of the first and second transistors. Two blocks sample and hold signals from the first and second sense amplifiers, which represent, respectively, the currents in the two separate current-measuring paths. The two currents are subtracted in a comparison node for generating an error signal that is compared with a predefined window and if outside the window a failure signal is generated.

A thermal control process for an electronic power device including a multi-junction integrated circuit may include defining a first and at least one second groups of junctions, with each group including one first and at least one second junctions, and associating a thermal detector with each group. A first group control may be executed which detects group electric signals representative of the temperature detected by the thermal detectors, processes the group electric signals with reference to a group critical thermal event, identifies a critical group when the corresponding group electric signal detects the critical group thermal event, and generates group deactivating signals suitable for selectively deactivating the first and the at least one second junctions of the identified critical group with respect to the remaining junctions of the integrated circuit.

Thermal control process for a multi-junction electronic power device and corresponding electronic power device

A fail-safe device may be coupled to a main device for actuating a switch responsive to a failure. The fail-safe device may include a fail-safe circuit, and an isolation trench surrounding the fail-safe circuit and isolating the fail-safe circuit from the main device. The fail-safe device may include an internal power supply connection, an internal reference voltage connection, a self-biased drive block configured to drive the at least one switch, and a receiver configured to receive failure signals from the main device.

Fail-safe device corresponding apparatus and vehicle

A driver device is for switching on and off a transistor for supplying a load by driving a control electrode of the transistor. The driver device includes a first terminal connected to the control electrode of the transistor, a second terminal connected between the transistor and the load, and a current-discharge path coupled to the first terminal. The current-discharge path includes a diode and is activated when the transistor is switched off. The diode becomes non-conductive to interrupt the current-discharge path when the voltage on the second terminal reaches a threshold value.

Driver device for transistors, and corresponding integrated circuit

A generator of a voltage logarithmically variable with temperature may include a differential amplifier having a pair of transistors, each coupled with a respective bias network adapted to bias in a conduction state the transistors first and second respectively with a constant current and with a current proportional to the working absolute temperature. The pair of transistors may generate between their control nodes the voltage logarithmically variable with temperature. The differential amplifier may have a common bias current generator coupled between the common terminal of the differential pair of transistors and a node at a reference potential, and a feedback line to provide a path for the current difference between the sum of currents flowing through the transistors of the differential pair and the common bias current.

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Pavia, Italy

Sergio Lecce