Corning Incorporated

Sergey Y Potapenko

Natesan Venkataraman

Prantik Mazumder

Dale Alan Webb

Nicholas Leon Susch

Joseph Richard Buono

A method for determining a shape of a substantially cylindrical specular reflective surface includes the step of obtaining calibration data and the step of obtaining target data about a target structure. The method further includes the step of defining a target line from the target data, where the target line represents a feature of the target structure and the step of capturing a reflected image of the target structure in the specular reflective surface. The method further includes the step of obtaining reflected data from the reflected image and the step of defining a reflected line from the reflected data, where the reflected line represents a reflection of the feature of the target structure. The method also includes the step of determining a correspondence between the target line and the reflected line and using the correspondence and the calibration data to determine the shape of the specular reflective surface.

Methods for determining a shape of a substantially cylindrical specular reflective surface

The invention relates to methods of making articles of semiconducting material and semiconducting material articles formed thereby, such as articles of semiconducting material that may be useful in making photovoltaic cells.

Methods of making an article of semiconducting material on a mold comprising particles of a semiconducting material

A method of measuring a shape of a specular reflective surface is provided. A pattern displayed on a surface of a target positioned at a target plane is produced from a specular reflective surface positioned at a measurement plane. An image of the reflection is recorded at an imaging plane. Positions of a plurality of points on the specular reflective surface relative to the imaging plane are determined. A first relation between feature positions on the image of the reflection and feature positions on the pattern is determined. The shape of the specular reflective surface is determined from a second relation involving a surface profile of the specular reflective surface and the first relation using the positions of the plurality of points as an initial condition.

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Painted Post, NY, United States of America

Sergey Y Potapenko