Samsung Electronics Co., Ltd.

International Center for Quantum Optics & Quantum Technologies Limited Liability Company

Sergey Nikolaevich Koptyaev

Alexey Andreevich Shchekin

Anton Sergeevich Medvedev

Alexey Dmitrievich Lantsov

Maxim Vladimirovich Riabko

Maxim Vladimirovich Ryabko

Stanislav Vladimirovich Polonsky

Maksim Vladimirovich Riabko

Nikolay Genad'evich Pavlov

Anton Nikolaevich Sofronov

Valery Evgenievich Lobanov

Andrey Sergeevich Voloshin

Igor Antonovich Bilenko

Grigoriy Vasil'evich Lihachev

Michael Nikolaevich Rychagov

Alexey Grigorievich Anikanov

Aleksandr Shorokhov

Mikhael Leonidovich Gorodetsky

Vasiliy Viktorovich Grigoriev

Pavel Alexandrovich Ivshin

Tatyana Igorevna Kopysova

Maksim Vladimirovich Ryabko

Alexey Dmitrievich Dmitrievich Lantsov

Vitali Valentinovich Vasiliev

Alexander Vyacheslavovich Shcherbakov

A thermal sensor, a thermal sensor array, an electronic apparatus including the thermal sensor, and an operating method of the thermal sensor are provided. The thermal sensor includes a first region onto which first infrared light is incident, a visible light radiation region configured to radiate visible light generated by incidence of the first infrared light on the first region, a second region onto which second infrared light is incident, and an image sensor configured to receive the visible light radiated from the visible light radiation region. The first region, the second region, and the visible light radiation region each include a nonlinear optical material.

Thermal sensor, thermal sensor array, electronic apparatus including the thermal sensor, and operating method of the thermal sensor

A spectrometer may include: a tunable on-chip laser source configured to irradiate a biological tissue with laser radiation; a photodetector configured to receive the laser radiation reflected from the biological tissue; and at least one processor. The tunable on-chip laser source may include: a semiconductor gain chip having a gain bandwidth for operating the tunable on-chip laser source in a predetermined wavelength range; and a plurality of resonator cavities connected between the semiconductor gain chip and the at least one processor, and configured to perform a coarse high-speed measurement and a fine measurement to measure a spectrum of the laser radiation reflected from the biological tissue.

Spectrometer including tunable on-chip laser and spectrum measurement method

An infrared detector includes a substrate in which a void is formed, a micro-resonator suspended over the void, an infrared absorber on an upper surface of the micro-resonator, a thermal isolation bridge supporting the micro-resonator, a first waveguide optically coupled with the micro-resonator, a second waveguide intersecting the first waveguide and optically coupled with the micro-resonator, a light source optically coupled with the first waveguide, and a photodetector optically coupled with the second waveguide.

Infrared detector and infrared image sensor including the same

Physiological parameter detecting apparatuses and methods of detecting the physiological parameters are provided. A physiological parameter detecting apparatus includes: a light source configured to emit a light onto a region of an object; an optical path converter configured to receive the light returning from the object and convert an optical path of the received light; an optical detector configured to detect the light that has the converted optical path; and a controller configured to extract physiological information of the object from the detected light.

Physiological parameter detecting apparatus and method of detecting physiological parameters

Provided are a laser device and a method of transforming laser spectrum, which provide a laser frequency stabilization and significant narrowing a laser spectrum. A laser device includes at least one multiple longitudinal mode laser (L) for generating a laser light having a spectrum of multiple longitudinal modes; at least one high quality factor (high-Q) microresonator (M) optically feedback coupled to the at least one multiple longitudinal mode laser (L); and a tuner (TU) for tuning the spectrum of multiple longitudinal modes of the laser light. The laser device is configured to output an output laser light having an output spectrum with at least one dominant longitudinal laser mode each at a reduced linewidth of the dominant longitudinal laser mode. The laser device allows increasing an emission power of a narrow linewidth lasing without an additional amplification while keeping a compact size of a device with a limited number of optical elements.

Laser device and method of transforming laser spectrum

A color imaging apparatus includes a filter having a meta surface, and configured to transmit only light in a first spectral region, a second spectral region and a third spectral region in a time sequence, a monochrome sensor on which the filter is disposed, and configured to acquire three different monochrome images in the time sequence by being consecutively exposed three times in synchronization with the filter, and a processor configured to acquire one color image by merging the three different monochrome images.

Color imaging apparatus using monochrome sensors for mobile devices

A biometrics authentication apparatus and a biometrics authentication method are disclosed. The biometrics authentication apparatus includes: a light source configured to emit a light; a modulator configured to change a spatial distribution of the light that is scattered and reflected from a region of interest of a user; a detector configured to detect an integral power of the light that is scattered from the region of interest; and a processor configured to obtain a measurement signal based on the integral power of the light, compare the measurement signal with a reference signal stored in a memory, and determine whether to authenticate the user based on a degree of match between the measurement signal and the reference signal.

Device and method for biometrics authentication

Provided is an optical source apparatus that may generate two different optical frequency combs. The optical source apparatus includes an optical resonator and a continuous wave laser emitting laser light having a spectrum component corresponding to a resonance frequency of the optical resonator, and the optical resonator is configured to generate a first frequency comb and a second frequency comb having different modes by interacting with the laser light emitted by the continuous wave laser.

Optical dual-comb source apparatuses including optical microresonator

Provided is an optical measurement system. The optical measurement system includes: an optical module which includes an optical system and which is configured to illuminate a sample and register a defocused image of a nanostructured surface of the sample, an optical system parameter control module configured to set optical parameters of the optical system, an optical transfer function (OTF) measurement module configured to measure an OTF, a defocused image calculation module configured to calculate the defocused image based on the measured OTF and the optical parameters, and a critical dimension (CD) evaluation module configured to compare the registered defocused image with the calculated defocused image of the nanostructured surface of the sample and to output a CD value of the nanostructured surface.

Optical measurement system and method for measuring critical dimension of nanostructure

An optical measurement system for measuring a critical dimension having a nanostructured surface including a nanostructure formed on a plane. The optical measurement system includes an image recording module including a microscope optical system which records a defocused image having an nonuniform degree of defocusing with respect to the nanostructured surface, an optical scheme parameter control module which sets and outputs to the microscope optical system optical scheme parameters for the microscope optical system, an image calculation module which receives receiving the optical scheme parameters set by the optical scheme parameter control module and calculates an image of the nanostructured surface, and a comparison module which compares the defocused image recorded by the image recording module and the image calculated by the image calculation module.

Optical measuring systems for measuring geometrical parameters of nano-objects and methods of measuring a critical size (CS) are provided. The optical method of measuring the CS includes selecting parameters of an optic scheme and an illumination condition; recording a set of nanostructure images corresponding to various wavelengths with various defocusing levels of scattered radiation; calculating a plurality of sets of images of a nanostructure with various defocusing levels, corresponding to various wavelengths of the scattered radiation with CS values within a known range; and comparing a set of measured images of the nanostructure with the sets of the calculated images and determining a best approximate value of the CS values.

Growing community of inventors

Moscow, Russia

Sergey Nikolaevich Koptyaev