Asml Netherlands B.v.

Asml Holding N.v.

Sergei Sokolov

Sebastianus Adrianus Goorden

Armand Eugene Albert Koolen

Simon Reinald Huisman

Su-Ting Cheng

Timothy A Brunner

Patrick Warnaar

Markus Franciscus Antonius Eurlings

Hendrik Jan Hidde Smilde

Krishanu Shome

Jin Lian

Lukasz Jerzy Macht

Mohammadreza Hajiahmadi

Sergey Tarabrin

Hilko Dirk Bos

Koenraad Remi André Maria Schreel

Filippo Alpeggiani

Fahong Li

Roxana Rezvani Naraghi

Lambertus Gerardus Maria Kessels

Karel Hendrik Wouter Van Den Bos

Fadi El-Ghussein

Lucas Tijn Kunneman

Ali Alsaqqa

Disclosed is a method for determining a stage position or correction therefor in a lithographic process. The method comprises obtaining transmission data describing the transmission of alignment radiation onto the substrate; obtaining position data relating to a stage position of said stage and/or a sensor position of said sensor. A weighting is determined for the position data based on said transmission data. The position based on said transmission data, position data and weighting.

Alignment method

A calibration system includes a plate, a fixed alignment mark, and a variable diffraction grating. The plate is adjacent to a wafer alignment mark disposed on a wafer. The fixed alignment mark is disposed on the plate and is configured to act as a reference mark for an initial calibration of the calibration system. The variable diffraction grating is disposed on the plate and includes a plurality of unit cells configured to form a plurality of variable alignment marks. The variable diffraction grating is configured to calibrate a shift-between-orders of one of the variable alignment marks and the fixed alignment mark.

Variable diffraction grating

Disclosed is an illumination system for delivering incoherent radiation to a metrology sensor system. Also disclosed is an associated metrology system and method. The illumination system comprises a spatial filter system for selective spatial filtering of a beam of said incoherent radiation outside of a module housing of the metrology sensor system. At least one optical guide is provided for guiding the spatially filtered beam of incoherent radiation to the metrology sensor system, the at least one optical guide being such that the radiation guided has a substantially similar output angle as input angle.

Metrology sensor, illumination system and method of generating measurement illumination with a configurable illumination spot diameter

Techniques for determining a value of a parameter of interest of a patterning process are described. One such technique involves obtaining a plurality of calibration data units from one or more targets in a metrology process. Each calibration data unit of at least two of the calibration data units represents detected radiation obtained using different respective polarization settings in the metrology process, each polarization setting defining a polarization property of incident radiation of the metrology process and of detected radiation of the metrology process. The calibration data units are used to obtain calibration information about the metrology process. A measurement data unit representing detected radiation scattered from a further target is obtained, the further target having a structure formed using the patterning process on the substrate or on a further substrate. A value of the parameter of interest is determined using the measurement data unit and the obtained calibration information.

Method of determining a value of a parameter of interest of a patterning process, device manufacturing method

A technique of measuring a parameter of a patterning process is disclosed. In one arrangement, a target, formed by the patterning process, is illuminated. A sub-order diffraction component of radiation scattered from the target is detected and used to determine the parameter of the patterning process.

Method of measuring a parameter of a patterning process, metrology apparatus, target

Disclosed is a method of measuring a focus parameter relating to formation of a structure using a lithographic process, and associated metrology device. The method comprises obtaining measurement data relating to a cross-polarized measurement of said structure; and determining a value for said focus parameter based on the measurement data.

Method of measuring a focus parameter relating to a structure formed using a lithographic process

Disclosed method of measuring a parameter relating to a structure formed using a lithographic process, and more specifically focus or line edge roughness. The method includes measuring a structure having a dimension, e.g., a critical dimension, which is sufficiently large to enable radiation diffracted by at least one edge of said structure to be (e.g., individually) optically resolved. The method comprises obtaining an intensity metric from an image of the at least one edge and determining a value for said parameter based on the intensity metric.

Method for of measuring a parameter relating to a structure formed using a lithographic process

Disclosed is a method of mitigating for a process dependent stray light artifact on a measurement a structure. The method comprises obtaining a calibration scaling factor for the process dependent stray light artifact based on a reference angle resolved measurement and target angle resolved measurement, and a correction of an image with the obtained calibration scaling factor.

Metrology method and apparatus, computer program and lithographic system

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Utrecht, Netherlands

Sergei Sokolov