Other

University of South Florida

University of California

H. Lee Moffitt Cancer Center and Research Institute, Inc.

Ultrasonic Technologies, Inc.

Sergei Ostapenko

Jin Z Zhang

Johnathan M Lancaster

Thomas A Sellers

Tatyana A Zhukov

Rebecca Sutphen

Chad Rodrigues

Igor Tarasov

An inspection device and method produces a deformation in a panel body and reveals a defect in the panel body. A base and a collar define a chamber. A vacuum device connects with the chamber for evacuating the chamber after the panel body is positioned adjacent to the collar and deflects the panel body into the chamber for propagating the defect in the panel body.

Inspection device and method

A method is disclosed for testing for delamination of a first composite component from a second composite component a composite material. The method comprises coupling a broad-band actuator to the composite material and connecting sweeping frequencies to the broad-band actuator for vibrating the composite material. An acoustic sensor is coupled to the composite material for measuring a resonant frequency curve of the vibrating composite material. The measured resonant frequency curve of the vibrating composite material is compared with a reference resonant frequency curve. A delaminated composite material produces a change in the measured resonant frequency curve relative to the reference resonant frequency curve. The method is suitable for detecting delamination in fuel cells as well as ceramic body armor.

Method and apparatus for detecting cracks and delamination in composite materials

An apparatus and a method are disclosed for testing the quality of a wafer. The apparatus and a method comprise coupling a broad-band actuator to the wafer. Sweeping frequencies are connected to the broad-band actuator for vibrating the wafer. An acoustic sensor is coupled to the wafer for measuring a resonant frequency of the vibrating wafer. The measured resonant frequency of the vibrating wafer is compared with a reference resonant frequency to deterring the quality of the wafer.

Method and apparatus for in-line quality control of wafers

Luminescent semiconductor quantum dots (QDs) conjugated with biomolecules to serve as sensitive probes for early detection of the cancer cells, specifically for ovarian cancer and lung cancer, which represents the most lethal malignancies. The luminescence characterization of the bin-conjugated QDs with cancer specific antigens using linkage molecules. Photo-enhancement is measured at various laser density power, temperatures and laser wavelengths.

Luminescence characterization of quantum dots conjugated with biomarkers for early cancer detection

A method of detecting and monitoring elastic strains in a semiconductor wafer ( ) comprising the steps of coupling the wafer ( ) to a transducer ( ) having a periphery ( ). This is followed by operating the transducer ( ) to produce ultrasonic vibrations at a predetermined wavelength &lgr; and propagating a standing wave through the wafer ( ) in response to the ultrasonic vibrations. The method is characterized by extending the wafer ( ) in a cantilevered section L from the periphery ( ) of the transducer ( ) to a distal end ( ), and measuring the amplitude of the standing wave &lgr; in the cantilevered section L. For maximum efficiency, the cantilevered section L is substantially one quarter of the predetermined wavelength (&lgr;/4).

Growing community of inventors

Wesley Chapel, FL, United States of America

Sergei Ostapenko