Lumileds LLC

Lumileds Lighting U.s., LLC

Hewlett-packard Company

Koninklijke Philips Corporation N.v.

Serge Laurent Rudaz

Daniel Alexander Steigerwald

Frederic Stephane Diana

Frank Lili Wei

Qingwei Mo

Kwong-Hin Henry Choy

Fred A Kish, Jr

Paul Scott Martin

Jerome Chandra Bhat

Steven A Maranowski

Michael Ragan Krames

Steven D Lester

Nick Holonyak, Jr

Brendan Jude Moran

Jeffrey Dellert Kmetec

Jonathan J Wierer, Jr

Michael Joseph Ludowise

Henry Kwong-Hin Choy

William R Imler

Robert M Fletcher

Li Zhang

Chun Lei

Iain Black

Cresente S Elpedes

Kyle J Thomas

Mark R Keever

Tim A Richard

In embodiments of the invention, a passivation layer is disposed over a side of a semiconductor structure including a light emitting layer disposed between an n-type region and a p-type region. A material configured to adhere to an underfill is disposed over an etched surface of the semiconductor structure.

Passivation for a semiconductor light emitting device

A submount for a light emitting stack includes a substrate and a metallization layer having circuit traces and a planar dielectric layer that fills regions between the circuit traces. The planar dielectric layer serves to minimize the amount of light lost/absorbed by the substrate and preferably reflects the internally reflected light back toward the desired light output element. To facilitate efficient manufacture, a dielectric paste is applied over the metallized layer, then planed to expose at least portions of the metal conductors for the subsequent coupling to the light emitting stack. Pedestal elements are preferably provided at select locations on the circuit traces to facilitate this coupling while allowing the remainder of the circuit traces to be covered with the dielectric layer.

Highly reflective coating on LED submount

A high performance, highly reflective ohmic contact, in the visible spectrum (400 nm&#x2013;750 nm), has the following multi-layer metal profile. A uniform and thin ohmic contact material is deposited and optionally alloyed to the semiconductor surface. A thick reflector layer selected from a group that includes Al, Cu, Au, Rh, Pd, Ag and any multi-layer combinations is deposited over the ohmic contact material.

Multi-layer highly reflective ohmic contacts for semiconductor devices

Silver electrode metallization in light emitting devices is subject to electrochemical migration in the presence of moisture and an electric field. Electrochemical migration of the silver metallization to the pn junction of the device results in an alternate shunt path across the junction, which degrades efficiency of the device. In accordance with a form of this invention, a migration barrier is provided for preventing migration of metal from at least one of the electrodes onto the surface of the semiconductor layer with which the electrode is in contact.

Light emitting semiconductor method and device

A device includes a submount, and a semiconductor light emitting device mounted on first and second conductive regions on a first side of the submount in a flip chip architecture configuration. The submount has third and fourth conductive regions on a second side of the submount. The third and fourth conductive regions may be used to solder the submount to structure such as a board, without the use of wire bonds. The first and third conductive regions are electrically connected by a first conductive layer and the second and fourth conductive regions are electrically connected by a second conductive layer. The first and second conductive layers may be disposed on the outside of the submount or within the submount.

Mount for semiconductor light emitting device

A light emitting device includes a heterojunction having a p-type layer and an n-type layer. The n-electrode is electrically connected to the n-type layer while the p-electrode is electrically connected to the p-type layer. The p and n-electrodes are positioned to form a region having uniform light intensity.

Electrode structures for light emitting devices

N-type doping in III-V-nitride semiconductor compounds, i.e. GaN-based compounds such as GaN, AlGaN, AlInN, InGaN, or AlGaInN, can be optimized to improve N-contact electrical resistance, carrier injection, forward voltage, and recombination characteristics without inducing cracking of the device layers. The N-type layer is constructed of sub-layers such that an N-type sub-layer is provided for each desired characteristic or property. The thickness of each sub-layer is carefully selected to avoid material cracking: the higher the required doping, the smaller the corresponding thickness. In illustration, the buffer layer of a light emitting device (LED) has three sub-layers. The first sub-layer is lightly doped to avoid cracking and is grown to the desired thickness for good material quality. The second sub-layer is heavily doped to provide good N-contact and electrical resistivity characteristics and is kept correspondingly as thin as necessary to avoid material cracking. The third sub-layer is doped to the desired level to provide optimum carrier injection and pair recombination in the active layer of the device.

Maximizing electrical doping while reducing material cracking in III-V

LEDs and other semiconductor devices fabricated with III-V materials and having exposed Al-bearing surfaces passivated with native oxides are disclosed. A known high temperature water vapor oxidation process is used to passivate the exposed layers of Al-bearing III-V semiconductor materials in confined-emission spot LEDs and other light emitting devices. These devices exhibit greatly improved wet, high temperature operating life, with little to no degradation in light output when exposed to such conditions.

Semiconductor devices fabricated with passivated high aluminum-content

Growing community of inventors

Sunnyvale, CA, United States of America

Serge Laurent Rudaz