Centre National De La Recherche Scientifique

Universitè De Montpellier

Inria Institut National De Recherche En Informatique Et En Automatique

Centre National De La Recherche Scientifique-Cnrs

Universite De Montpellier Ii

Serge Bernard

David Andreu

Yves Bertrand

David Guiraud

Philippe Cauvet

Florence Azais

Marie-Lise Flottes

Ziad Noun

Guy Catheras

Jérôme Galy

Jean-Denis Techer

Michel Renovell

Jerome Galy

A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.

System and method for wirelessly testing integrated circuits

A device (ES) for distributing power between n cathodes (Ki) of at least one multipolar stimulating electrode (EM) comprises at least one anode (A), wherein n is equal to or greater than two. Said device (ES) comprises a reconfigurable current mirror (MC) which is provided with n outputs (K'i) connectable to said n cathodes (Ki), respectively and supplies to the n (K&#x2032;i) outputs n complementary fractions of a control current having respective selected values which are substantially constant at the control current amplitude variation in order to carry out a substantially constant spatial location of stimulation.

Device for distributing power between cathodes of a multipolar electrode, in particular of an implant

A device for self-testing of an analog-to-digital converter includes elements for applying to the converter test signals and analyzing elements. The analyzing elements include common resources ( ) integrated in the circuit bearing the converter and capable of being configured to determine successively shift, gain and non-linearities of the converter and elements for configuring and controlling the common resources ( ) so as to adapt them to the characteristics to be determined.

Method and device for integrated testing for an analog-to-digital converter

Growing community of inventors

St. Georges D'Orques, France

Serge Bernard