Samsung Electronics Co., Ltd.

Seong Jin Jang

Kyoung Ho Kim

Cheon An Lee

Jong Pil Son

Jong Hyun Choi

Jin Seok Kwak

Sung Min Seo

Gil Su Kim

Jong Min Oh

Sang Joon Hwang

A method for reading data stored in a fuse device included in a memory device including a memory cell array is provided. The method comprises reading trimming data of the fuse device, wherein the trimming data is related to trimming a level of voltage or a level of current used for an operation of the memory device; and after the reading the trimming data, reading defective cell address data of the fuse device, wherein the defective cell address data is related to defective cells in the memory cell array.

Method of reading data stored in fuse device and apparatuses using the same

A semiconductor memory device is provided. The semiconductor memory device supplies to a sense amplifier a first voltage and a second voltage during data sensing, so that data sensing margin and a data sensing speed increase.

Semiconductor memory device and method of driving the same

A circuit for generating a reference voltage includes a first reference voltage generating circuit disposed outside a chip and a second reference voltage generating circuit disposed inside the chip. The first and second reference voltage generating circuits output first and second reference voltages to first and second output terminals, respectively. The second reference voltage generating circuit includes at least one pull-up resistor and at least one pull-down resistor. The pull-up resistor is coupled between a first node where an internal power supply voltage is coupled and the second output terminal. The pull-down resistor is coupled between a second node and the second output terminal, wherein a voltage at the second node is relatively lower than a voltage at the first node. A third reference voltage is outputted from a node where the first output terminal is coupled to the second output terminal.

Methods and circuits for generating reference voltage

A bit line pre-charge circuit for a dynamic random access memory (DRAM) uses a charge sharing scheme. The pre-charge circuit includes switching elements disposed between a power voltage node and an output node, capacitors connected between intermediate nodes and ground. The switching elements being operated by successively activated control signals to effectively charge a bit line pair to one half a power voltage using charge sharing between the capacitors.

Circuit precharging DRAM bit line

A circuit and method are provided for controlling the gate voltage of a transistor acting between local and global input/output lines of a memory device, the circuit including a local input/output line, a local from/to global input/output multiplexer in signal communication with the local input/output line, a global input/output line in signal communication with the local from/to global input/output multiplexer, and a local from/to global input/output controller having an input node and an output node, the input node disposed for receiving a signal indicative of an input or output operation, and the output node in signal communication with a gate of the local from/to global input/output multiplexer for providing a gate signal of a first or second level in the presence of the output operation, and a gate signal of a third level in the presence of the input operation.

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Seongnam-si, South Korea

Seong Jin Jang