Samsung Electronics Co., Ltd.

Seong-Jin Cho

Jung Min You

Sang-Uhn Cha

Ye-Sin Ryu

Hoi-ju Chung

Hijung Kim

Won-hyung Song

Sang-Hoon Jung

Hoon Sin

Won-Hyung Song

A memory device, including a memory cell array including a plurality of memory cell rows; a monitoring cell array configured to detect a victim memory cell row of the plurality of memory cell rows, and to generate bit data; a bit data decoder configured to: receive the bit data, and based on the bit data, generate a victim memory address including address information about the victim memory cell row; and a refresh manager configured to perform a refresh operation on the victim memory cell row based on the victim memory address.

Memory device and operating method thereof

A memory device includes a memory cell array including a plurality of rows, an ECC engine configured to determine a health level for each of the plurality of rows based on the number of corrections of errors of data read from each of the plurality of rows, a control logic configured to determine a victim row address based on the health level and the number of accesses for each of the plurality of rows, and a refresh control circuit configured to perform a refresh on a row corresponding to the determined victim row address.

Memory device and operating method with mechanism to determine victim rows for refreshing

A semiconductor memory device includes a memory cell array having a plurality of rows of memory cells therein, and a row hammer handler configured to generate a refresh address when performing a refresh operation on the plurality rows of memory cells. The row hammer handler (RHH) includes a weight distributor configured to: receive a plurality of row addresses, assign a weight to each of the plurality of row addresses thus received, and to generate weight data corresponding to each of the plurality of row addresses. The RHH also includes an aggress address generator configured to determine an aggress address of a row of memory cells based on the weight data, and a refresh address generator configured to receive the aggress address and to generate the refresh address, which includes address information of a memory cell row adjacent the aggress address.

Semiconductor memory devices having enhanced refresh operations that inhibit row hammer hacking

According to an embodiment, a memory device includes a memory cell array including a plurality of memory cells; and a control logic which includes a mode register, performs a refresh operation in response to a refresh command, generates an internal mode register write command in response to the refresh command in a first mode, and does not generate the internal mode register write command in response to the refresh command in a second mode.

Memory device and memory system including the same

Disclosed is a memory device which includes a memory core that includes a plurality of memory cells, and control logic that receives a first active command and a first row address from an external device and activates memory cells corresponding to the first row address from among the plurality of memory cells in response to the first active command. The control logic includes registers and counters. The control logic records the first row address in one of the registers, counts an activation count of the first row address by using a first counter of the counters, and counts a lifetime count of the first row address by using a second counter of the counters.

Memory device data loss prevention

A memory device is provided. The memory device includes a plurality of memory chips that are stacked, wherein each of the memory chips includes a memory cell array, which includes a plurality of memory cell rows, a chip identifier generator configured to generate a chip identifier signal indicating a chip identifier of each of the memory chips, a refresh counter configured to generate a target row address for refreshing the memory cell rows in response to a refresh command, and a refresh row address generator, which receives the chip identifier signal and the target row address and outputs one of the target row address and an inverted target row address, obtained by inverting the target row address, as a refresh row address based on the chip identifier signal, and performs a refresh operation on a memory cell row corresponding to the refresh row address.

Memory device and semiconductor device including the same

A memory device including a memory bank array which includes a first edge memory block, a second edge memory block, and a plurality of memory blocks placed between the first edge memory block and the second edge memory block; a plurality of sense amplifiers between the plurality of memory blocks, and that connect a first bit line of a memory block on one side of each of the plurality of sense amplifiers and a first complementary bit line of a memory block on an other side of each of the plurality of sense amplifiers; a first edge sense amplifier connected to a second bit line and a second complementary bit line of the first edge memory block; and a second edge sense amplifier connected to a third bit line and a third complementary bit line of the second edge memory block.

Memory device that stores number of activation times of word lines

Disclosed is a method for accessing memory cells arranged in rows and columns. The method includes activating a specific row of the rows of the memory cells, and flipping data bits stored in memory cells of the specific row in response to determining that concentrated activation occurs at the specific row.

Compensating for concentrated activation of memory cells in a semiconductor memory device

A memory module includes data memories and at least one parity memory. Each of the data memories includes a first memory cell array with a first memory region to store data set corresponding to a plurality of burst lengths and a second memory region to store first parity bits to perform error detection/correction associated with the data set. The at least one parity memory includes a second memory cell array with a first parity region to store parity bits associated with user data set corresponding to all of the data set stored in each of the data memories and a second parity region to store second parity bits for error detection/correction associated with the parity bits.

Memory modules, memory systems including the same and methods of operating memory systems

A semiconductor memory device includes a memory cell array, a control logic circuit, and an error correction circuit. The control logic circuit generates control signals by decoding a command. The control logic circuit, in a write mode of the semiconductor memory device, controls the error correction circuit to read a first unit of data from a selected sub-page and to generate a first parity data based on one of the first sub unit of data and the second sub unit of data and a main data to be written into the sub-page while generating syndrome data by performing an error correction code decoding on the first unit of data. The error correction circuit, when a first sub unit of data includes at least one error bit, selectively modifies the first parity data based on a data mask signal associated with the main data.

Semiconductor memory devices and methods of operating the same

A method of operating a semiconductor memory device is provided. In a method of operating a semiconductor memory device including a memory cell array which includes a plurality of bank arrays, memory cells in a first region of the memory cell array are tested to detect one or more failed cells in the first region, a fail address corresponding to the detected one or more failed cells is determined and the determined fail address is stored in a second region different from the first region, in the memory cell array.

Growing community of inventors

Hwaseong-si, South Korea

Seong-Jin Cho