Samsung Electronics Co., Ltd.

Seokhyeon Kim

Sangho Lee

Kihyun Kim

Yonghoon Kim

Juho Son

Hyunchul Park

Youngchang Yoon

Kyuhwan An

Donggyu Minn

The present disclosure relates to a pre-5-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4-Generation (4G) communication system such as Long Term Evolution (LTE). An electronic device and an operation method thereof are provided for testing performance of a radio frequency integrated circuit (RFIC) in a wireless communication system. The method includes checking a connection state of elements operable as combiners and a plurality of RF chains of the RFIC; performing control to output RF signals from the plurality of RF chains; acquiring an integrated signal by combining the RF signals via the combiners; and determining a quality indicator for the RFIC based the integrated signal.

Device and method for testing RF integrated circuit in wireless communication system

Growing community of inventors

Gyeonggi-do, South Korea

Seokhyeon Kim