Samsung Electronics Co., Ltd.

Seok-Young Yoon

Hyeck-Jin Jeong

Jong-Keun Jeon

Heui-Seog Kim

Jung-Hyun Park

Jun-Young Ko

Se-Un Lee

Hyeck-Jin Joung

Jin-Woog Kim

Seok-Ho Jin

An apparatus includes a test board for testing electrical characteristics of the semiconductor chip; socket pins vertically disposed on the test board to electrically connect the test board, and external terminals of the semiconductor chip; socket springs interposed between the socket pins and the test board and making the socket pins vertically elastic; a plurality of laser beam transmitters vertically penetrating the socket pins, the socket springs, and the test board; and a laser beam source supplying laser beams to the laser beam transmitters.

Apparatus and method for testing semiconductor chip

A POGO pin that can measure low frequency products as well as RF products and also have a long life span, and a test socket including the POGO pin are provided. The POGO pin includes a metal plunger formed of a conductive metal so as to electrically contact the semiconductor package, and a rubber contact pin connected with the metal plunger and formed of a conductive rubber so as to electrically contact the test board.

POGO pin and test socket including the same

In an example embodiment, an insert having an independently movable latch mechanism for loading a semiconductor package may include an insert body having a pocket, latch units installed at opposite sides of the pocket, and a press plate elastically installed above the insert body. The latch units prevent a loaded semiconductor package from escaping out of the pocket. The press plate may operate the latch unit by movement relative to an upper surface of the insert body. Each latch may be movably connected to the insert body such that a first end of the latch is rotatable around a fixed shaft pin. A second end of the latch may be movable into and out of the pocket. The latch may have a front surface slanted downwards towards the center of the pocket and have a guide hole near the back surface, opposite the front surface. A button connected to the latch by a moving shaft pin may be elastically coupled between the latch and the press plate, the button projecting upwards from the insert body and converting the movement of the press plate into rotational movement of the latch by causing the moving shaft pin to move along the guide hole. The movement of the shaft pin rotates the latch about the fixed shaft pin. The guide hole includes a guide hole correction space that permits movement of the moving shaft pin into the guide hole correction space such that the latch rotates about the fixed shaft pin independent of the movement of the press plate. An elastic body may be located between a back of the latch having the guide hole and the insert body near to the side of the latch, such that the elastic body applies an elastic force to a latch so as to cause the latch to protrude into the pocket.

Insert having independently movable latch mechanism for semiconductor package

The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof. Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.

Growing community of inventors

Chungcheongnam-do, South Korea

Seok-Young Yoon