Cypress Semiconductor Corporation

Senwen Kan

Jeffrey W Gossett

Richard A Rodell, Jr

Andrew Payne

Bjarni Benjaminsson

Michael Joseph Pluhta

A physical unclonable function (PUF) device is disclosed. The PUF device includes ring oscillators. Each ring oscillator generates an oscillating signal based on an input challenge. The PUF device further includes counters. Each counter counts a number of oscillations in an oscillating signal generated by a corresponding ring oscillator, and produce a counter value representing the counted number of oscillations. The PUF device further includes comparators. Each comparator compares a counter value with a median counter value, and produce a resulting value. The PUF device further includes a response generator that generates a first response based on the resulting values. The first response includes an address used to index into a memory device to read PUF data and memory repair data from the memory device. The PUF device further includes a PUF output generator that generates a second response based on the PUF data and the memory repair data.

Synergistic physical unclonable function (PUF) using memory repair data and ring oscillators

An apparatus for on demand access and cache encoding of repair data. In one embodiment the apparatus includes an integrated circuit having a data cache in data communication with a non-volatile memory, a controller of a built-in self-test-and-repair (BISTR) circuit, and a plurality of registers. The controller is configured to read data from the data cache and store it into a first of the plurality of registers.

Apparatus for on demand access and cache encoding of repair data

A system and method for centrally logging and aggregating miscompares on chip during a memory test. The method includes performing, by a built-in self-test (BIST) unit of a memory device, a memory test on one or more memory banks of the memory device using a first algorithm. The method includes generating miscompare results responsive to performing the memory test on the one or more memory banks of the memory device. The method includes determining failure diagnostic information based on the miscompare results. The method includes generating an error packet comprising the failure diagnostic information and the miscompare results. The method includes placing the error packet in a queue of a plurality of error packets to generate a queued error packet.

Centrally logging and aggregating miscompares on chip during memory test

A system and method for using a programmable macro built-in self-test (BIST) to test an integrated circuit. The method includes receiving, by a built-in self-test (BIST) controller of an integrated circuit (IC) device from a testing equipment, a test vector of a first type for testing a first region of the IC device. The method includes identifying, based on the test vector of the first type, a first BIST engine of a plurality of BIST engines associated with the first region of the IC device. The method includes generating, based on the test vector of the first type, a first command of the second type. The method includes configuring, based on the first command of the second type, the first BIST engine of the plurality of BIST engines to cause the first BIST engine to perform a first set of tests on the first region of the IC device.

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Austin, TX, United States of America

Senwen Kan