Guzik Technical Enterprises

Semen P Volfbein

Valeriy Serebryanskiy

A measurement of phase frequency response of a device under test (DUT), wherein the DUT is characterized by a set of switchable configurations, comprises choosing the steps of a particular configuration of the DUT having nominal parameters as a reference configuration, measuring an amplitude frequency response A(f) and a phase frequency response &#x3d5;(f) of the reference configuration, processing all configurations of the DUT which are different from the reference configuration, one after another, by measuring an amplitude response A(f) of the configuration being processed, calculating a minimum phase difference response &#x394;&#x3d5;(f); and calculating for each configuration, a phase frequency response &#x3d5;(f) of the respective configuration which is being processed, in accordance with &#x3d5;(f)=&#x3d5;(f)+&#x394;&#x3d5;(f).

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Palo Alto, CA, United States of America

Semen P Volfbein