Faz Technology Limited

Selwan K Ibrahim

John O'Dowd

Roger Maher

John Dunne

Tom Farrell

Devrez Mehmet Karabacak

Martin Farnan

The invention provides a measurement system to interrogate at least one birefringent optical sensor and a method to interrogate birefringent optical sensors at high speed and high resolution. The system and method detects, at least, a first and a second spectral feature that are polarization dependent, wherein the detected first and second spectral features correspond to different responses of at least one birefringent optical sensor.

Measurement system and method to interrogate birefringent optical sensors with a frequency swept source based interrogator

The invention provides a dynamically swept tunable laser system and method for measuring sensor characteristics obtained from an array of optical sensors comprising means for dividing the total wavelength sweep of the laser into different regions in any particular order where each region contains single or multiple contiguous sweep segments and where each sweep segment is referenced by a start and a stop reference and can have different lengths compared to the other sweep segments. The sensor characteristics are determined from each region swept by the tunable laser. The invention provides for the tunable laser to be adapted to operate in a quasi-continuous mode to select segments in any order. The relative sweep rates of regions can be changed such that some regions can be swept more times than other regions.

System and method for dynamically sweeping a tunable laser

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Dublin, Ireland

Selwan K Ibrahim