Mitsubishi Denki Kabushiki Kaisha

Jasco Corporation

The University of Tokyo

Japan Spectroscopic Co., Ltd.

Advanced Bio-spectroscopy Co., Ltd

Japan Science and Technology Agency

Ihi Corporation

Seizi Nishizawa

Ryo Hattori

Takashi Ushida

Tokuji Takahashi

Katsuko Furukawa

Ryoichi Fukazawa

Tokuzi Takahashi

Ryoichi Fukasawa

Kikuo Shirawachi

An object is to provide a technique that can evaluate biological tissues such as cartilage tissue and regenerated tissues such as regenerated cartilage. A method for observing a dynamic physical property of a biological tissue according to the present invention is that a biological tissue is irradiated with a pulsed light having a wavelength of a far-infrared wavelength region modulated into circular polarized lights by applying bias voltages to a radiation means () having an antenna electrode films of orthogonal ()-axis structure with phases shifted using high-voltage high-speed modulation means (), and dynamic physical property of the biological tissue is observed on the basis of a spectrum obtained by vibration optical activity spectroscopy.

Method for observing dynamic physical property of biological tissue and device for observing dynamic physical property of biological tissue

An apparatus for measuring the thickness of a semiconductor layer includes a light source emitting light; an interferometer producing modulated interference light by modulating the light from the light source; an optical system including a light transmission member for introducing the modulated interference light into a measurement sample including at least one film on a substrate; a light detecting element for detecting the modulated interference light reflected from the film and producing an output signal in response; an extracting element for extracting a film interference component having a waveform from the output signal; and an element for calculating the thickness of the film from the waveform of the output signal component. The light detecting element includes a plurality of photodetectors having respective photometric wavenumber ranges that overlap. Thereby, a wavenumber range that is the sum of the respective wavenumber ranges of the respective components is obtained and an optical measurement can be realized over a wide wavenumber range that could not be measured with a single photodetector.

Optical apparatus components having spectrally overlapping

An apparatus for and a method of evaluating a multilayer thin film of the present invention. An interference light beam in a predetermined wave number region is projected as a parallel beam onto a multilayer thin film sample and the interference light beam reflected by the sample is detected to find an interferogram. The interferogram is subject to Fourier transform, filtering and reverse Fourier transform so that a spatialgram is provided. Thereby the variation in incident angle of the light beam incident on the sample and in incident surface is reduced, and the spatialgram can be provided with accurate information of the multilayer thin film.

Apparatus for and method of evaluating multilayer thin film

A continuous drive type Michelson interferometer system for use in Fourier spectroscopy, having a main Michelson interferometer for obtaining the interferogram of a sample, an auxiliary Michelson interferometer for detecting the moving speed of a movable mirror of said main Michelson interferometer, and a control section for controlling the driving speed of said movable mirror. In said control section, the AC output signal of a photodetector is converted into a voltage corresponding to the frequency of the signal, said voltage is compared with a preset voltage by a voltage difference detection means, the phase of said AC output of said photodetector is compared with a phase of a reference signal by a phase comparison means, and said driving speed is controlled by both the outputs of said voltage difference detection means and said phase comparison means.

Michelson interferometer

Growing community of inventors

Tokyo, Japan

Seizi Nishizawa