Kabushiki Kaisha Toshiba

Seiro Imai

Yukihiro Fujimoto

Tsuneaki Fuse

Kazuhiko Miki

Kaoru Nakagawa

According to one embodiment, a semiconductor storage device includes cells, and a sense amplifier. Each of the cells is connected to a bit line. The sense amplifier reads out data. The sense amplifier includes a first transistor to third transistor, and a switch. The first transistor has one end of a current path, the other end, and a gate. The second transistor has one end, and the other end. The second transistor has one of a first and a second supply ability. The third transistor has one end, and the other end. The third transistor has one of a third and a fourth supply ability. The switch grounds the second and the third transistors. The sense amplifier turns off the first transistor after transferring the data to an outside, and supplies the second signal to the switch to set gates of the second transistor and third transistor to ground.

Semiconductor storage device

A semiconductor integrated circuit includes: a current difference sense type of a sense amplifier including: an input line connected to memory cells as a target to be read, a reference line connected to reference cells, and a first pre-charge circuit configured to pre-charge the input line and the reference line; a second pre-charge circuit configured to perform pre-charging of the input line and pre-charging of the reference line; and a control circuit configured to control the second pre-charge circuit so that the second pre-charge circuit may perform both the pre-charging of the input line and the pre-charging of the reference line independently of each other, and start both the pre-charging of the input line and the pre-charging of the reference line earlier than pre-charging by the first pre-charge circuit.

Semiconductor integrated circuit and method for controlling the same

A sense amplifier control circuit includes an initial-voltage setting circuit configured to set a control signal to an initial voltage, the control signal controlling a sensing operation of a sense amplifier, and a control-signal-level adjusting circuit configured to first change a voltage level of the control signal from the initial voltage to a voltage level at which the sense amplifier can execute a current sensing, and is configured to second change, after a predetermined time elapses, the voltage level at which the sense amplifier can execute the current sensing to a voltage level at which the sense amplifier can execute a voltage sensing.

Sense-amplifier control circuit and controlling method of sense amplifier

A semiconductor memory includes memory cells for even addresses arranged in a first memory array and storing even addressed data, word lines for even addresses arranged parallel to a row direction of the first memory array and selecting the memory cells for even addresses, bit lines for even addresses arranged parallel to a column direction of the first memory array and transferring the even addressed data to the memory cells for even addresses, memory cells for odd addresses arranged in a second memory array and storing odd addressed data, word lines for odd addresses arranged parallel to a row direction of the second memory array and selecting the memory cells for odd addresses, and bit lines for odd addresses arranged parallel to a column direction of the second memory array and transferring the odd addressed data to the memory cells for odd addresses.

Semiconductor memory

A semiconductor memory device is disclosed, which includes a first SRAM cell which includes cross-connected first and second inverters having first and second nodes, a first transistor connected between a first bit line and the first node and having a gate connected to a first write word line, a second transistor connected between a second bit line and the second node and having a gate connected to the first write word line, a third transistor having a gate connected to the second node, a fourth transistor connected between the first bit line and the third transistor and having a gate connected to a read word line, and a second SRAM cell which includes fifth-eighth transistors corresponding to the first-fourth transistors and has substantially the same configuration as the first SRAM, wherein the drains of the fourth and eighth transistors are connected to the first and second bit lines, respectively.

Semiconductor memory device

A semiconductor integrated circuit is provided with a plurality of selectors, each of which is connected to a corresponding one of a plurality of data lines through which bit data read out from a corresponding one of a plurality of cell array blocks is transmitted, wherein a selector control circuit controls selection operations of the selectors based on a control clock so that the selectors select and output readout data in the order in which the bit data are read out from the corresponding cell array blocks.

Growing community of inventors

Tokyo, Japan

Seiro Imai