Murata Manufacturing Co., Ltd.

Tohoku University

Seiji Kamba

Takashi Kondo

Kazuhiro Takigawa

Yuichi Ogawa

Masaru Banju

Yoshiji Okamoto

Hisatake Okamura

Naoki Mizoguchi

Koji Tanaka

Seiichi Matsumoto

Wataru Yamamoto

Naoki Kawara

Masayuki Suzuki

Tetsuzo Hara

Shinichiro Hayashi

Makoto Hasegawa

Takashi Shimizu

Ryoichi Fukasawa

Sakura Tomita

Tomofumi Ikari

A separation recovery system for separating and recovering an object to be separated includes a metal porous membrane which has a first principal surface and a second principal surface facing the first principal surface and has a plurality of through-holes extending between the first principal surface and the second principal surface, a supply device which supplies a first fluid containing the object to be separated from the first principal surface of the metal porous membrane toward the second principal surface, and a backwash device which supplies a second fluid containing a plurality of particles larger than a size of the plurality of through-holes of the metal porous membrane in a direction from the second principal surface of the metal porous membrane toward the first principal surface.

Separation recovery system and separation recovery method

A filtration filter comprises a metallic mesh having a circumferential shape and radially inner and outer portions. The metallic mesh is adapted to filter out a filtration target object contained in a fluid passing through the membrane. First and second frame members hold the outer portion there between so as to create first and second bent sections separated by a transition section extending between the first and second bent sections. The transition section includes at least one streaked projection.

Filtration filter

A film-shaped aperture array includes a first principal surface and a second principal surface opposed to each other and a plurality of apertures penetrating the first principal surface and the second principal surface. A projection projecting from the second principal surface in a normal direction of the second principal surface is provided in at least one region in contact with three or more of the plurality of apertures in a part of the second principal surface, when viewed in plan from the normal direction of the second principal surface.

Aperture array and production method therefor

A filtration filter comprises a porous film including a central film portion having a plurality of through holes and an outer edge portion adjacent to the central film portion. The porous film portion lies in a flat plane in the absence of a force being applied to the central portion of the central film portion. A frame holds the outer edge portion of the porous film in such a manner that when a force is applied to the central film portion in a first direction, the central film portion moves in the first direction relative to the flat plane and the outer edge portion moves in a second direction, opposite to the first direction, relative to the flat plane. In this way stresses applied to the porous film during a filtering operation are reduced.

A measurement method measures an amount of substance of an analyte in a sample fluid passing through a perforated structure having a pair of principal surfaces opposed to each other and having a plurality of cavity portions extending through both of the principal surfaces. An elapsed time from a time when the sample fluid begins passing through the perforated structure or a predetermined time thereafter to a time when a characteristic value of the perforated structure reaches a predetermined threshold. The elapsed time is used to determine the amount (the concentration) of substance of the analyte.

Measurement method and measurement system

A void-arranged structure that includes a pair of principal surfaces opposing each other and a plurality of void sections that penetrate through the pair of principal surfaces. The void-arranged structure is configured of a plurality of unit structures each of which includes a first void section and a second void section having a different shape from a shape of the first void section, and the overall shape of the unit structure, when the principal surface is viewed from above, is not mirror-symmetric with respect to a predetermined imaginary plane orthogonal to the principal surface of the void-arranged structure.

Void-arranged structure and measurement method using the same

The present invention is a method for extracting nucleic acid. A biological sample existing in a fluid is trapped using metal mesh. The biological sample contains nucleic acid and a coating structure covering the nucleic acid. The metal mesh with the biological sample trapped thereon is immersed in a nucleic acid extractant. The nucleic acid extractant is a solvent for the nucleic acid but not for the coating structure.

Extraction method, analytical method, extraction device, and analytical device

A fixing instrument includes a first frame member () and a second frame member () that clamp and fix an aperture array structure. At least any of conditions of Expression 1: A+C&#x3e;Band Expression 2: A+C&#x3e;Bis satisfied where Arepresents a distance between a first reference surface () and a first inner peripheral fitting face (), Arepresents a distance between the first reference surface () and a first outer peripheral fitting face (), Brepresents a distance between a second reference surface () and a second inner peripheral fitting face (), Brepresents a distance between the second reference surface () and a second outer peripheral fitting face (), and C represents a thickness of an outer peripheral section () of the aperture array structure.

Fixing instrument and metal mesh device

The characteristics of a specimen are measured by holding the specimen on an aperture array structure having apertures, applying an electromagnetic wave to the aperture array structure, and detecting frequency characteristics of the electromagnetic wave reflected by the aperture array structure. A liquid is directly or indirectly attached to at least a part of a first principal surface. The electromagnetic wave is applied from side including a second principal surface. The apertures of the aperture array structure have a size which does not allow the liquid to leak from the first principal surface side to the second principal surface side, and the liquid is attached to the first principal surface of the aperture array structure in a state open to an atmosphere under air pressure.

Specimen measuring method

An aperture array structure used in a method of measuring characteristics of a specimen by applying an electromagnetic wave to an aperture array structure on which the specimen is held, and detecting frequency characteristics of the electromagnetic wave scattered by the aperture array structure. The aperture array structure includes a first principal surface, a second principal surface opposed to the first principal surface, and a plurality of apertures extending through the aperture array structure in a direction perpendicular to the first principal surface and the second principal surface. An opening area of each aperture at the first principal surface is smaller than an opening area of each aperture at the second principal surface.

Aperture array structure and measurement method using the same

A perforated-structure body having a plurality of apertures that penetrate from a first main surface to a second main surface of a perforated plate. Support substrates are stacked on at least one of the first main surface and the second main surface of the perforated plate so as to define a portion through which at least one of the apertures is exposed.

Perforated-structure body, manufacturing method therefor, and measurement apparatus and measurement method

A measurement device that includes a device main unit including at least one cavity for accommodating an analyte containing a specimen and an aperture array structure including a plurality of apertures extending therethrough in a direction perpendicular to a principal surface thereof. The aperture array structure is fixed such that part or all of the aperture array structure is positioned in the cavity.

Measurement device and feature measurement method of object to be measured employing same

A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.

Method and apparatus for measuring characteristics of object

A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte.

Growing community of inventors

Nagaokakyo, Japan

Seiji Kamba