Horiba, Ltd.

National Institute for Materials Science

Seiji Higuchi

Aya Takeda

Tomonobu Nakayama

Kusuo Ueno

A laser analysis device includes a laser analysis unit that a sample is irradiated with laser light, a cover that covers a periphery of the laser analysis unit, so as to prevent the laser light from being emitted to outside, and has a slit in at least a part of the cover, a fastener configured to open and close the slit, and an interlock mechanism including a key provided on the fastener and a detector that detects a state in which the fastener is fully closed, in which in a state where the detector has detected that the fastener is fully closed, laser light having a predetermined intensity or more is introduced into the laser analysis unit.

Laser analysis device

The present claimed invention shortens cleaning time of a container of a sample dispersing device and reduces variation of a cleaning state. The present claimed invention is a sample dispersing devicethat disperses a powder sample (W) on an upper surface of an analytical memberand that comprises a containerthat has a placing surfaceon which the analytical memberis placed, an introducing mechanismthat introduces the powder sample (W) into inside of the container, and a covering memberthat covers an inner surface of the containerand that can be attached to and removed from the container

Sample dispersing device and sample dispersing method

A main object of the present claimed invention is to provide a scanning probe microscope that can recognize a relative position between multiple probes accurately. The scanning probe microscope comprises multiple probesmovable in the XYZ-directions, a stageon which a specimenis placed and that is movable in the XY-directions, a detecting partthat detects the physical properties that changes with the movements of each of the probesin the Z-direction according to the surface shape of the specimen, at a time when each of the probesor the stageis moved in the XY-directions, an image generating partthat images the surface image of the specimenin response to the detected signals from the detecting part, and a relative position calculating partthat obtains the surface image based on each of the probesand obtained by the image generating part, when the stageis moved in the XY-directions without changing a relative position between the probesin the XY-directions, and calculates the relative position between the probesby checking the surface images obtained by the probes.

Growing community of inventors

Kyoto, Japan

Seiji Higuchi