Fujitsu Corporation

Fujitsu Semiconductor Limited

Seiichiro Yamaguchi

Isao Amano

Mitsuaki Kai

Hiroshi Arimoto

Tsuyoshi Sakata

Hiroki Miyaoka

A simulation instructing unit instructs a simulation unit, which generates signal characteristics, to generate the signal characteristics. A characteristic value extracting unit extracts, from the signal characteristics, characteristic values for distinguishing between a signal characteristic generated by setting a first simulation parameter and a signal characteristic generated by a second simulation parameter. A simulation parameter determining unit determines a first mapping relationship from the characteristic values to the simulation parameters with the characteristic values obtained by setting a plurality of set values in the simulation parameters and with the set values.

Computer aided design apparatus, computer aided design program, computer aided design method for a semiconductor device and method of manufacturing a semiconductor circuit based on characteristic value and simulation parameter

A recording medium stores a verification program that causes a computer to execute detecting from a model circuit, a first circuit representing junction of a source region and a substrate region and including a junction resistance and a junction capacitance, a second circuit parallel to the first circuit, representing junction of a drain region and the substrate region, and including a junction resistance and a junction capacitance equivalent to the junction resistance and capacitance of the first circuit, and a connection resistance connecting the circuits and a substrate electrode; calculating, using the junction resistances and connection resistance, a first coefficient indicating impact of the junction resistances and connection resistance on amplitude variation; calculating, using the junction capacitances and connection resistance, a second coefficient indicating impact of the junction capacitances and connection resistance on phase variation; correcting the junction capacitances using a sum of the coefficients; and outputting a correction result.

Verification computer product, method, and apparatus

The semiconductor device comprises: a conducting layer including: a channel region; a source region and a drain region sandwiching the channel region; and a body region connected to the channel region and being adjacent to the source region and the drain region; a gate electrode formed above the channel region interposing a gate insulation film therebetween; a dummy electrode formed on the body region near the interface between at least the drain region and the body region, and electrically insulated with the gate electrode; and a body contact region formed in the body region except a region where the dummy electrode is formed. The gate electrode and the dummy electrode are electrically insulated with each other, whereby the semiconductor device having body contacts can have a gate capacitance much decreased. Accordingly, deterioration of the speed performance of the transistors can be suppressed.

Semiconductor device and method for fabricating the same

The semiconductor device includes: a conducting layer including: a channel region; a source region and a drain region sandwiching the channel region; and a body region connected to the channel region and being adjacent to the source region and the drain region; a gate electrode formed above the channel region interposing a gate insulation film therebetween; a dummy electrode formed on the body region near the interface between at least the drain region and the body region, and electrically insulated with the gate electrode; and a body contact region formed in the body region except a region where the dummy electrode is formed. The gate electrode and the dummy electrode are electrically insulated with each other, whereby the semiconductor device having body contacts can have a gate capacitance much decreased. Accordingly, deterioration of the speed performance of the transistors can be suppressed.

Growing community of inventors

Kawasaki, Japan

Seiichiro Yamaguchi