Innotech Corporation

Seiichi Ohashi

Minoru Yoshida

A probe (A) has a cutting blade portion () at a tip end that is brought into contact with a pad electrode (). The cutting blade has a cutting edge that is in a plane parallel to the direction of sliding of the blade over a pad electrode, when the edge is brought into contact with the electrode. The cutting edge () has a sloping or curved shape that comes closer to the electrode from the front side to the rear side of the blade along the direction of sliding. Thus, as the cutting edge () cuts into an insulating coating () formed on the surface of the electrode, the probe ensures satisfactory electrical conduction between the probe (A) and the electrode because it cuts through the coating without causing swarfs.

Growing community of inventors

Yokohama, Japan

Seiichi Ohashi