Growing community of inventors

Saitama, Japan

Seiichi Izawa

Average Co-Inventor Count = 3.82

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 5

Seiichi IzawaKoichi Tanaka (12 patents)Seiichi IzawaKenkichi Hayashi (12 patents)Seiichi IzawaAkihiro Uchida (12 patents)Seiichi IzawaHideo Kobayashi (8 patents)Seiichi IzawaShinichiro Fujiki (4 patents)Seiichi IzawaSeiichi Izawa (13 patents)Koichi TanakaKoichi Tanaka (184 patents)Kenkichi HayashiKenkichi Hayashi (152 patents)Akihiro UchidaAkihiro Uchida (47 patents)Hideo KobayashiHideo Kobayashi (59 patents)Shinichiro FujikiShinichiro Fujiki (23 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Fujifilm Corporation (13 from 16,115 patents)


13 patents:

1. 12436405 - Imaging device including shake correction mechanism, and operation method and operation program thereof

2. 11822097 - Imaging device including shake correction mechanism, and operation method and operation program thereof

3. 11467367 - Imaging device, imaging method, and program

4. 11448894 - Imaging device including shake correction mechanism, and operation method and operation program thereof

5. 11418711 - Lens interchangeable digital camera, and operation method and operation program thereof

6. 11394868 - Imaging device, imaging method, and program

7. 11375118 - Imaging device, imaging control method, and program

8. 11336815 - Focusing control device, focusing control method, and program

9. 11294145 - Imaging device, imaging method, and program capable of suppressing decrease in autofocusing accuracy

10. 11115593 - Lens interchangeable digital camera, and operation method and operation program thereof

11. 10904441 - Imaging device, imaging control method, and program

12. 10802380 - Imaging device, imaging control method, and program

13. 8488429 - Electron beam exposure system and electron beam exposure method

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