Samsung Electronics Co., Ltd.

Sei-bum Ban

Moon-sik Jeong

Tae-suh Park

Yong-beom Lee

Yong-Beom Lee

A method, medium and apparatus for correcting a projected image is provided. The method includes detecting a pattern image based on photographing information of consecutive image frames into which a reference pattern and an offset pattern corresponding to the reference pattern are alternately inserted and which are projected onto a projection surface accordingly, and correcting projected image frame, based on the detected pattern image.

Method, medium and apparatus correcting projected image

A method and apparatus are provided for unobtrusively estimating the characteristics of a projection surface, in order to correct the distortion of images resulting from the characteristics of the projection surface in the case of a projector. The method includes projecting at least one reference pixel and at least one counterbalance pixel corresponding to the reference pixel onto consecutive image frames, and correcting an image frame to be projected using correction information determined based on photographic information of the reference pixel.

Growing community of inventors

Yongin-si, South Korea

Sei-bum Ban