Advanced Micro Devices Corporation

Seck June Foo

Zhihong Mai

Seok Hiong Tan

A test circuit for and method of testing integrated circuit packages can be utilized to determine the existence of one or more short circuits between adjacent connectors. The system includes an interface configured to electrically connect the conductors of the integrated circuit package. The interface groups the conductors into a plurality of nodes. The number of nodes is no more than one-half the number of conductors. A control circuit is coupled to the interface. The control circuit determines the existence of one or more short circuits between adjacent conductors in response to signals on the nodes.

Growing community of inventors

Johor Bahru, Malaysia

Seck June Foo