Honeywell Asca Inc.

Honeywell International Inc.

Honeywell G.m.b.h.

Sebastien Tixier

Michael Kon Yew Hughes

Frank Martin Haran

Tobias Nebel

Gertjan J Hofman

Adrian Matias Fuxman

Stephane Savard

Gregory Edward Stewart

Johan Backstrom

Stuart James Heath

Michael R Hughes

Adam Krolak

Michael K Y Hughes

Paul Mounter

Charles P Luebke

Matthew Martin

Kurt Kraus

James W Harris

John F Shakespeare

Fouad Nusseibeh

Graham I Duck

Jeffry Thurston Donner

Reena Meijer Drees

Daniel A Gordon

Iouri Markevitch

Ian Charles Baron

Kelsey Gerbrandt

Reena Meijer-Drees

Gertjan Job Hofman

John Shakespeare

Michael Ky Hughes

Frank M Haran

A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

Lib anode coating measurement with dual x-ray

A measurement apparatus for weight measuring composite sheet including a sheet material having a second material thereon as a coating and/or as embedded particles therein. The apparatus includes an x-ray sensor for providing an x-ray signal from x-ray irradiating the composite sheet and an infrared (IR) sensor for providing an IR signal from IR irradiating the composite sheet. A computing device is coupled to receive the x-ray signal and the IR signal that includes a processor having an associated memory for implementing an algorithm, where the algorithm uses the x-ray signal and the IR signal to compute a plurality of weights selected from a weight of the sheet material, a weight of the second material, and a total weight of the composite sheet.

Apparatus for composite sheet weight determinations

An accurate and stable displacement sensor that reads through coated metal substrates achieves better than one micron accuracy includes: an electromagnetic coil positioned in a first enclosure; (ii) means for generating a magnetic field from the electromagnetic coil; (iii) a second enclosure which is spaced apart from the first enclosure, wherein the second enclosure includes dual magnetic sensors, such as fluxgate sensors, that are configured to measure the magnetic field; and (iv) means for calculating the separation between the operative surfaces of the enclosures from magnetic field measurements. A permanent magnet can be used instead of the electromagnetic coil and associated driving energy source. A precise displacement measurement is given by a mathematical function (such as the ratio or difference) of the two magnetic sensors demodulated signals. The displacement sensor can be mounted on a maneuverable C-frame to monitor the caliper of anodes and cathodes produced for lithium ion batteries.

High accuracy and high stability magnetic displacement sensor in the presence of electromagnetic interferences

Methods and systems for monitoring a flare burner with a camera. The methods and systems which may indicate to operators the presence or absence of one or more of smoke, flare flame, and steam plume and record those indications or measurements. Additionally, the methods and systems may confirm whether compliance with local regulations on visual emissions, smoke plume is achieved. The methods and systems automatically adjust the delivery rate of key inputs including measures assist fuel gas, purge gas, steam and/or air simultaneously to maintain or attain compliance with said local regulatory requirements. Also, methods for a machine learning process for using controller inputs to identify normal and abnormal flare states and provide visual indications and flare operation recommendations.

Processes and systems for analyzing images of a flare burner

A measurement apparatus includes an x-ray sensor including an x-ray source having a high voltage power supply for emitting an x-ray spectrum and an x-ray detector for providing a measured x-ray signal value responsive to the x-rays received after transmission through a coated substrate including a sheet material having a coating material thereon. A second sensor is a beta gauge or infrared sensor for providing a second sensor signal that includes data for determining a total weight per unit area of the coated substrate or of the sheet material A computing device receives the measured x-ray signal value and the second sensor signal configured to implement an x-ray based calculation that utilizes absorption coefficients for the coating material and sheet material, the measured x-ray signal value, the x-ray spectrum, and the weight measure as a calculation constraint, for computing at least the weight per unit area of the coating material.

X-ray-based determining of weights for coated substrates

A measurement apparatus includes a beta gauge for generating a first sensor response signal from a composite sheet including a sheet material having a coating thereon including a high-z material or the sheet material has particles including the high-z material embedded in the sheet material. A second sensor being an x-ray or an infrared (IR) sensor provides a second sensor response signal from the composite sheet. A computing device is coupled to receive the first and the second sensor response signal that includes a processor having an associated memory for implementing an algorithm that uses the first and the second sensor response signal to simultaneously compute two or more weight measures selected from (i) a weight per unit area of the high-z material, (ii) a weight per unit area of the sheet material, and (iii) a total weight per unit area of the composite sheet.

Apparatus for simultaneously determining weights of composite sheets

Non-contacting caliper measurements of free-standing sheets detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface and scanning the laser beam through a selected wavelength range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected from the exposed outer surface and from the inner surface. Alternatively, the intensity of an interference pattern formed from the superposition of radiation that is directly transmitted through the web and radiation that is transmitted through the web after internal reflections from the internal surfaces of the web. Thickness can be extracted from the fringe separation in the interference pattern.

Thickness determination of web product by mid-infrared wavelength scanning interferometry

A sensor system includes an eddy current sensor including at least one coil with excitation electronics coupled across the coil. An optical displacement sensor is secured to the eddy current sensor so that a vertical distance between the sensors is fixed. The optical displacement sensor is located on top of and concentric with the coil so that a measurement axis of the optical displacement sensor is collinear with an axis of symmetry of the coil. A computing device including a processor and memory is coupled to receive sensor data from the eddy current sensor and the optical displacement sensor that is adapted for analyzing the sensor data obtained from measuring a coated substrate including a coating layer on at least one side of a metal substrate to determine at least a thickness of the coating layer.

Thickness measurement with inductive and optical displacement sensors

Time-of-flight measurements calculate the absolute caliper of a moving film independent of the film's index of refraction. A reflective fiber coupled terahertz gauge is mounted co-axially with a temperature stabilized Z-sensor positioned within a scanner head. The terahertz gauge monitors four reflections: (1) the reflection from a sensor window, (2, 3) the reflections from the top and bottom surfaces of the sheet product being measured, and (4) the reflection from a reflector that is placed behind the sheet. The Z-sensor monitors the distance between the reflector and the sensor window. The terahertz reflection delays together with the Z distance measurements allow extraction of the caliper. Since the time delay due to the sheet is a function of thickness and index of refraction, the basis weight of the sheet can be determined by using a calibration of the sensor relating basis weight of the product to time delay.

Scanning caliper and basis weight sensor for sheet products using terahertz

A measurement apparatus includes a first sensor, scanner head, and computing device coupled to the first sensor that stores relative signal level ranges at selected spectral marker region(s) compared to a common region each corresponding to a composite sheet material grade and an associated sensor calibration. The computing device measures a first signal in the spectral marker region and a second signal in the common region of a composite sheet including a sheet material and a high-z material, determining a current relative signal level comparing a current signal level of the first and second signal, and identifying a current composite sheet material grade for the composite sheet from the composite material grades using the current relative signal level. Based on the current composite material grade a current sensor calibration is chosen from the sensor calibrations, and &#x2265;1 physical parameter for the composite sheet is determined from the current sensor calibration.

Online grade selection for weight measurements of composite sheets

An apparatus includes a transmitter configured to transmit a signal including an electromagnetic pulse towards material in a tank. The apparatus also includes a receiver configured to receive a signal including multiple reflections of the pulse. The apparatus further includes at least one processing device configured to process the received signal and determine a measurement associated with the material in the tank. To process the received signal, the at least one processing device is configured to fit multiple models onto the received signal, select one of the models, identify at least one of the multiple reflections in the received signal using the selected model, and determine the measurement using the at least one identified reflection in the received signal. Each model is constructed from a superposition of multiple types of pulse reflections.

Apparatus and method for measuring thin material thicknesses in inventory management applications

Non-contacting caliper measurements of free standing sheets such as porous polymer and paper detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface wherein the laser beam comprises radiation having a wavelength in the 3-50 micron range and scanning the laser beam through a selected angle range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected from the exposed outer surface and from the inner surface. Thickness can be extracted from the fringe separation in the interference pattern. Rotating and focusing elements ensure that the spot position on the sheet remains the same while varying the incident angle.

Caliper sensor and method using mid-infrared interferometry

Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.

Spectroscopic sensor for thickness or weight measurement of thin plastic films

Near infrared moisture sensors using stable holmium oxide glass calibration standards that simulate different moistures levels in paper obviates problems associated with glass encased paper samples. Holmium oxide glass has a strong absorption at 1.93 microns which is close to absorption by paper. Standards can have varying thicknesses to simulate different moisture levels. Didymium glass can also be used with holmium oxide glass. The moisture sensor operates at reference and measurement infrared regions of 1.94 microns and 1.8 microns, respectively.

Holmium oxide glasses as calibration standards for near infrared moisture sensors

Non-contacting caliper measurements of free standing sheets such as porous polymer and paper detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface wherein the laser beam comprises radiation having a wavelength in the 3-50 micron range and scanning the laser beam through a selected angle range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected From the exposed outer surface and from the inner surface. Thickness can be extracted from the fringe separation in the interference pattern. Rotating and focusing elements ensure that the spot position on the sheet remains the same while varying the incident angle.

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Vancouver, Canada

Sebastien Tixier