Nanolive Sa

Sebastien Equis

Pierre-Alain Cotte

Yann Cotte

Andreas Kern

Bastian Dalla Piazza

Sorin Pop

Luca Clario

Christopher Tremblay

Optical diffraction tomography microscope () comprising an illumination system () configured for transmitting a sample beam through a sample observation zone, a detection system () comprising at least one image sensor (), and a wave collection system () comprising a lens () downstream of the sample observation zone configured for directing the sample beam towards the at least one image sensor.

Optical diffraction tomography microscope

A microscopic object characterization system comprises a computer system, a microscope with a computing unit connected to the computer system, and an object characterization program executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of the microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on the refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object. The computer system further comprises a feedback interface configured for connection to one or more data servers in a network computing system, via a global communications network such as the internet, and configured to receive feedback data from the data servers for processing by the object characterization program to calibrate, refine or enhance a characterization of the features.

Method of characterizing and imaging microscopic objects

A microscope comprising a coherent light source producing a coherent light beam, a light beam guide system comprising a beam splitter configured to split the coherent light beam into a reference beam and a sample illumination beam, a sample holder configured to hold a sample to be observed, a sample illumination device configured to direct the sample illumination beam through the sample and into a microscope objective, a beam reuniter configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Microscope with rotating beam system

Microscopic object characterization system (), comprising a computer system (), a microscope () with a computing unit () connected to the computer system, and an object characterization program () executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of said microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on said refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object. The computer system further comprises a feedback interface configured for connection to one or more data servers in a network computing system, via a global communications network such as the internet, and configured to receive feedback data from the data servers for processing by the object characterization program to calibrate, refine or enhance a characterization of said features.

Microscope () comprising a coherent light source () producing a coherent light beam (), a light beam guide system () comprising a beam splitter () configured to split the coherent light beam () into a reference beam () and a sample illumination beam (), a sample holder () configured to hold a sample () to be observed, a sample illumination device () configured to direct the sample illumination beam () through the sample and into a microscope objective (), a beam reuniter () configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system () configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Growing community of inventors

Penthalaz, Switzerland

Sebastien Equis