Thermo Fisher Scientific (Bremen) Gmbh

Thermo Fisher Scientific Gmbh

Sebastian Geisler

Ayrat Murtazin

Eike Jasper

Ruan Hattingh

Alexander Alekseevich Makarov

Lothar Rottmann

Norbert Quaas

Mikhail G Skoblin

Tobias Wolf

Konstantin Ayzikov

Jan Rathkamp

Konstantin Aizikov

Dirk Wohlers

Mikhail Skoblin

A method of processing two dimensional optical spectra, such as echelle spectra, is disclosed. The optical spectra comprise sections having a relatively high intensity separated by borders having a relatively low intensity. The optical spectra have been digitized () by a detector. The method comprises denoising () an optical spectrum, searching () for at least one series of neighboring local extrema of the optical spectrum, fitting () a line through each series of neighboring local extrema, each line representing a section, identifying () any peaks and their respective locations, and storing () the lines and the locations of any peaks.

Method and device for processing two-dimensional optical spectra

A diagnostic testing method for a detector of a spectrometer. The spectrometer comprises a source of line spectra configured to emit at least one branched pair of spectral lines from an excited species. The method comprises performing a plurality of detector diagnostic measurements and diagnosing a detector operating condition. Each detector diagnostic measurement comprises measuring an intensity of a first spectral line emitted by an excited species of the source of line spectra using the detector, and measuring an intensity of a second spectral line emitted by the excited species of the source of line spectra using the detector. The first and second spectral lines emitted by the excited species of the source of line spectra form a branched pair of spectral lines, and the spectrometer is controlled to vary the intensity of the first and second spectral lines incident on the detector for the plurality of detector diagnostic measurements.

Diagnostic testing method for a spectrometer

A plasma source chamber () for use in a spectrometer comprises an inner housing () for accommodating a plasma source () and an outer housing () accommodating the inner housing. The outer housing () comprises at least one outer air inlet opening () in a first wall and at least one outer air outlet opening () in a second wall. Walls of the inner housing and walls of the outer housing define a spacing () so as to allow a first air flow () from the at least one outer air inlet opening () to the at least one outer air outlet opening () through the spacing () between the inner housing and the outer housing. The inner housing () comprises at least one inner air inlet opening () in a first wall and at least one inner air outlet opening () in a second wall to allow a second air flow () from the at least one inner air inlet opening to the at least one inner air outlet opening through the inner housing. Thus, an improved cooling of the outer surfaces of the plasma source chamber is achieved.

Plasma source chamber for a spectrometer

A protection device for an Optical Emission Spectrometer (OES) and a method of protecting a detector to which purge gas is supplied, in an OES, are disclosed. The protection device comprises a timer, which measures a parameter, such as a humidity value, indicative of a shut down time period following cessation of application of purge gas to the detector. The protection device comprises a processor, which determines a start-up time period, based on the parameter, during which purge gas is supplied to the detector prior to cooling of the detector. The processor may selectively trigger commencing or maintaining application of purge gas to the detector or cooling of the detector in dependence on the parameter.

Detector protection in an optical emission spectrometer

Detector protection in an optical emission speedometer

Growing community of inventors

Bremen, Germany

Sebastian Geisler