Afl Telecommunications Lcc

Bin1 Ate, LLC

Other

Teradyne, Inc.

Sean Patrick Adam

Scott Prescott

Barry Edward Blancha

Paulo Souza Mendes

Carlos Heil

Jorge Camargo

Leszek Janusz Lechowicz

Stephen S Helm

Joseph Fitzgerald

Dale Eddy

John P Toscano

Jack Michael Thompson

William J Bowhers

Michael John Leighton

Jeffrey Alexander Harding

Rhonda L Allain

Sten J Peeters

Urszula B Tasto

D Dane Krampitz

Scott H Prescott

A method of conducting wireless fiber inspection includes obtaining a video stream from an inspection probe and transmitting the video stream over a Wi-Fi network. The method further includes creating the Wi-Fi network using a Wi-Fi hotspot, performing image analysis on the obtained video stream, and transmitting the image analysis along with the video stream over the Wi-Fi network.

Wireless inspection solution

A method of concurrently testing a plurality of transmission mediums, using a testing device incorporating at least one processor and a single test program that allows a user to view multiple instruments as a single instrument with multiple input and output ports, includes setting up a plurality of instrument functions to perform tests on the plurality of transmission mediums using the single test program, and concurrently performing tests on the plurality of transmission mediums using the plurality of instrument functions.

Parallel testing of multiple optical fibers

A method of tracing a complete span of a fiber includes inferring a reference point on the fiber based on a measured length of the fiber, setting a pulse width and a measurement range based on the inferred reference point, shooting a fiber from a master unit, attached to one end of the fiber, to collect trace past the inferred reference point, shooting a fiber from a slave unit, attached to an opposite end of the fiber, to collect trace past the inferred reference point, cropping the collected traces captured by the master unit and the slave unit past the inferred reference point, inverting a slope of the trace of the slave unit using measurement loss information and combining the trace of the master unit and the trace of the slave unit, with the inverted slope, to obtain a complete and accurate trace of the fiber.

Shooting long fiber spans with high loss fiber

An optical fiber test apparatus includes an optical power meter operable to detect light at a predetermined wavelength, and a laser source operable to generate a visible laser beam. The optical fiber test apparatus further includes an optical fiber extending between a first end and a second end, and a diplexer which includes a first optical connector and is coupled to the optical power meter, the laser source, and the first end of the optical fiber. The optical fiber test apparatus further includes a second optical connector coupled to the second end of the optical fiber and including a test port. The diplexer is operable to transmit light at the predetermined wavelength from the second optical connector to the optical power meter and transmit the visible laser beam from the laser source to the second optical connector.

Optical fiber test apparatus with combined light measurement and fault detection

The present invention is related to a method of connecting a first device comprising a processor and an application and a second device comprising a processor and an application, a distributed architecture system for facilitating modular communication between a plurality of applications, a plurality of devices, and a plurality of applications and devices, and a computer readable medium storing a program for causing a processor to connect a plurality of applications, a plurality of devices, and a plurality of applications and devices.

Distributed test system architecture

The present disclosure describes a method, an apparatus, and a non-transitory computer-readable medium storing a program for measuring characteristics of a WDM system. The method may include obtaining channel characteristics of a channel, calculating a Health Factor of a channel using the characteristics, and displaying the Health Factor and characteristics of a channel on a display device.

Providing channel health for a WDM system

A system and method is provided for performing processing in a test system. A flexible platform may be provided for developing test programs for performing automated testing. In one such platform, the tester and its instruments are isolated from the tester operating system, permitting any tester operating system to be used. In another example implementation, a user layer of the platform is isolated from the physical layer of the architecture, permitting hardware-independent test programs that can be created and used among different testers having different test hardware and software. In yet another implementation, execution of a test program is isolated from a tester platform operating system, permitting the test program to function independent from the tester platform. In another embodiment, functionality is implemented on the platform such that functions are only added, and that existing links to functions are not broken, ensuring continued test system operation when new software, hardware and/or features are added to the platform. The test system may include a non-deterministic computer system. In one example test system, the system forces execution of one or more computer instructions performed by the non-deterministic computer system to execute within a constant execution time. A deterministic engine, if necessary, waits a variable amount of time to ensure that the execution of the computer instructions is performed over the constant execution time. Because the execution time is constant, the execution is deterministic and therefore may be used in applications requiring deterministic behavior. For example, such a deterministic engine may be used in automated test equipment (ATE) applications.

System and method for performing processing in a testing system

Test systems and methodologies are provided and may include platforms for developing test programs for automated testing. In one example, tester and instruments are isolated from the tester OS, permitting any OS to be used. In another, a user layer is isolated from the physical layer, permitting hardware-independent development and usability among different tester platforms. In another, test program execution is isolated from a tester platform OS, permitting test program function independent from tester platform. In another embodiment, functions are only added, existing links to functions are not broken, ensuring continued operation with new software, hardware and/or features. Systems may be non-deterministic. In one example, the non-deterministic computer is required to execute computer instructions within a constant execution time. A deterministic engine, may be used to wait a variable amount of time to ensure constant execution time. Execution over constant time is deterministic permitting applications requiring deterministic behavior.

Test systems and methodologies are provided and may include platforms for developing test programs for automated testing. In one example, tester and instruments are isolated from the tester OS, permitting any OS to be used. In another, a user layer is isolated from the physical layer, permitting hardware-independent development and usability among different tester platforms. In another, test program execution is isolated from tester platform OS, permitting test program function independent from tester platform. In another embodiment, functions are only added, existing links to functions are not broken, ensuring continued operation with new software, hardware and/or features. Systems may be non-deterministic. In one example, the non-deterministic computer is required to execute computer instructions within a constant execution time. A deterministic engine may be used to wait a variable amount of time to ensure constant execution time. Execution over constant time is deterministic permitting applications requiring deterministic behavior.

An adapter frame is configured to receive a non-native test instrument module and is further configured for coupling within a test head of automatic semiconductor device test equipment. The adapter frame includes interfaces for operatively connecting the test instrument module to the test head using the existing slots of the test head. Interfaces may include mechanical interfaces, such as liquid cooling interfaces and other suitable interfaces. Additional software and/or hardware components may be included on the adapter frame to integrate the non-native test instrument module into the existing test equipment.

Method and apparatus for cooling non-native instrument in automatic test equipment

An apparatus and method for deskewing single-ended signals from different driver circuits of an automatic test system provides enough of a reduction in skew to allow differential signals to cross at or near their 50%-points. In accordance with this technique, first and second driver circuits are respectively coupled to first and second inputs of a measurement circuit through pathways having known and preferably equal propagation delays. The first and second driver circuits each generate an edge that propagates toward the DUT, and reflects back when it reaches a respective unmatched load at the location of the DUT. In response to the edge and its reflection, the first and second inputs of the measurement circuit each see a first voltage step and a second voltage step. The interval between the first and second voltage steps is then measured for each input of the measurement circuit. Variable delay circuits disposed in series with the driver circuits are adjusted in response to the measured intervals, to ensure that signals from the first and second driver circuits arrive at the DUT at substantially the same time. The measurement circuit may also measure the slew rates of the signals from the first and second driver circuits. Slew rate adjustment circuits provided with the driver circuits are then adjusted to substantially equalize slew rates from the first and second driver circuits.

Growing community of inventors

Wrentham, MA, United States of America

Sean Patrick Adam