Nippon Steel Sumitomo Metal Corporation

Sean C Bohun

Junichi Nakagawa

Tadayuki Ito

Masahiro Yamamoto

Kozo Saito

Tetsuo Nishiyama

Masahiro Doki

Belal Gharaibeh

Huaxiong Huang

Keng Hoo Chuah

Ahmad Salaimeh

Tomoya Takeuchi

Kazufumi Ito

A defect on the surface or in the surface layer of a moving material can be detected by using a method comprising steps of: heating the surface of the material, obtaining thermal image data of the surface of the material using an infrared thermography camera while the surface of the material is being heated up at the heating step or being cooled down after heating, and detecting the defect by calculating Laplacian with respect to temperature of the surface represented by the thermal image data. When the thermal image data is obtained while the material is being heated up, a heating device and the camera is arranged so that thermal energy emitted from the heating device is reflected by the material to come into the camera.

Method for detecting defect in material and system for the method

Growing community of inventors

Oshawa, Canada

Sean C Bohun