Samsung Electronics Co., Ltd.

Se-young Jang

Masaharu Tsukue

Young-jun Moon

A test unit to test a board having an area array package mounted therein includes the board, the area array package having an electronic component, a plurality of package pins including a plurality of contact pins connected with the electronic component and a plurality of no-contact pins not connected with the electronic component, and a plurality of contact members respectively provided on the plurality of contact pins and the plurality of no-contact pins to connect the plurality of package pins with the board, a plurality of board contact parts provided on the board and connected with the plurality of contact members to be connected with the plurality of package pins, at least one first connection part provided in the area array package to electrically connect the plurality of no-contact pins with each other in pairs, at least one second connection part provided on the board to electrically connect the plurality of board contact parts with each other in pairs to form a circuit line arranged alternately with the first connection part through the plurality of contact members, and at least one test point provided at opposite ends of the circuit line to measure a resistance between the first and second connection parts. Thus, the test unit can test a connection state of the plurality of contact members without difficulty.

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Seoul, South Korea

Se-young Jang