Samsung Display Co., Ltd.

Samsung Displayco., Ltd.

Se Yoon Oh

Sung Hoon Yang

Jin Wook Seo

Hyung Lee

Dae Hong Kim

Hoon Jong Kang

Min Jae Jeong

Chong Sup Chang

Jong Hwan Lee

Seung Hwa Ha

Woo Suk Seo

Hyungjin Lee

Sang Heon Ye

Bum Soo Kam

A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.

Method for inspecting display device and method for fabricating display device

A display device includes a first non-folding area and a second non-folding area, a display panel disposed in the first non-folding area and the second non-folding area, a leveling layer on the display panel in the first non-folding area, a protection window on the leveling layer in the first non-folding area, and a transmission control layer on the display panel in the second non-folding area. A thickness of the transmission control layer is substantially equal to a sum of a thickness of the leveling layer and a thickness of the protection window.

Display device

An inspecting device of a display panel includes a contact including first probe pins that contact to data pads of a display panel and second probe pins that contact to common voltage pads of the display panel, a signal generator coupled to the first probe pins, the signal generator configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level, a power generator coupled to the second probe pins, the power generator configured to generate a first common voltage and a second common voltage of which a voltage level is different from a voltage level of the second common voltage, and a defect detector configured to detect a defect of the display panel by removing a contact noise generated due to contact failure of the first probe pins and the second probe pins.

Inspecting device of display panel and inspecting method of display panel using the same

A method for manufacturing a display device includes preparing a target panel including a first substrate and a second substrate disposed on one surface of the first substrate, the target panel including a sealing area between the first substrate and the second substrate, making sealing light be incident in the sealing area and receiving at least a part of the sealing light reflected from the sealing area, generating first data including at least one parameter of intensity, energy, current, and voltage, and determining whether sealing is defective by comparing the first data and prestored second data.

Apparatus for manufacturing display device and method for manufacturing display device

In a device for detecting a defect, the device includes: an image pickup unit including pixels, the image pickup unit generating a substrate image by picking up an image of a substrate having patterns formed on a top surface thereof; and a controller for detecting a defect located on the substrate, based on the substrate image, wherein the substrate image includes pattern images corresponding to the patterns, wherein each of the pattern images includes pixel values, wherein the controller detects the defect by comparing weights of pixel values for each of the pattern images.

Device for detecting defect and method of driving the same

A method for manufacturing a display device includes forming a plurality of light blocking patterns on a first surface of a transparent substrate, wherein a first light blocking pattern of the plurality of light blocking patterns has a different line width than a second light blocking pattern of the plurality of light blocking patterns. An insulating layer is formed on the first surface of the transparent substrate and the light blocking patterns. A conductive layer is formed on the insulating layer. A photo-resist layer is formed on the conductive layer. The photo-resist layer is exposed with ultraviolet rays through a second surface of the transparent substrate, wherein the first and second surfaces of the transparent substrate are opposite to each other. The photo-resist layer is developed. The conductive layer is etched using the photo-resist layer as a mask. The photo-resist layer is removed.

Growing community of inventors

Yongin-si, South Korea

Se Yoon Oh