Agilent Technologies, Inc.

Keysight Technologies, Inc.

Scott W Indermuehle

Lawrence Muray

James P Spallas

Charles S Silver

Ying Wu

Dimitri Klyachko

A scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) apparatus that includes a scanning electron microscope, an x-ray detector, and an auxiliary acceleration voltage source. The scanning electron microscope includes a sample holder, and a layered electron beam column arranged to output an electron beam towards the sample holder at an initial beam energy. The auxiliary acceleration voltage source is to apply an auxiliary acceleration voltage between the sample holder and the layered electron beam column to accelerate the electron beam to a final beam energy. At the final beam energy, the electron beam is capable of generating x-rays at multiple wavelengths from a larger range of atomic species than the electron beam at the initial beam energy.

High-voltage energy-dispersive spectroscopy using a low-voltage scanning electron microscope

A scanning charged particle microscope includes a layered charged particle beam column package; a sample holder; and a layered micro-channel plate detector package located between the column package and the sample holder.

Layered scanning charged particle microscope package for a charged particle and radiation detector

Growing community of inventors

Danville, CA, United States of America

Scott W Indermuehle