Sv Probe Pte. Ltd.

Scott R Williams

Bahadir Tunaboylu

David T Beatson

Edward T Laurent

Edward Lambert Malantonio

John McGlory

John Shuhart

Guy Frick

Alan Slopey

A probe card for testing of semiconductor dice is provided. The probe card includes a mounting plate and a plurality of substrate segments supported by the mounting plate.

Probe card with segmented substrate

A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.

Cantilever probe structure for a probe card assembly

A probe card is provided including a first substrate, a second substrate, and a plurality of conductive wires extending between the first substrate and the second substrate. The conductive wires are fixed (a) at a first end to a contact of the first substrate, and (b) at a second end to a contact of the second substrate.

Probe card with stacked substrate

A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.

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Saint George, UT, United States of America

Scott R Williams