Particle Measuring Systems, Inc.

Covidien LP

Scott MacLaughlin

Brian A Knollenberg

Matt Michaelis

Brett Haley

Jon Skuba

Clayton Ellinwood

Benjamin Martinez

Joseph Thomas Cilke

A method for reducing false-positive particle detection events of an optical particle detection system includes: filtering raw particle count data to produce filtered particle count data. The filtering includes: temporarily storing the raw particle count data for a buffering time period; segmenting the raw particle count data into a series of elemental data intervals; examining each elemental data interval for a noise signature; identifying a noise signature in the segmented raw particle count data; in response to the identified noise signature, flagging one or more sequential elemental data intervals as corresponding to a noise event; and removing the one or more flagged elemental data intervals from the raw particle count data to produce the filtered particle count data, and/or generating replacement data and substituting the replacement data for the one or more flagged elemental data intervals to produce the filtered particle count data.

Systems and methods for reducing false positive particle detection events in a particle detector

The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.

Particle detectors with remote alarm monitoring and control

The invention generally provides systems and methods for particle detection for minimizing microbial growth and cross-contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. In some embodiments, systems of the invention incorporate a housing having an outer surface being a first antimicrobial surface and a touchscreen being a second antimicrobial surface. In some embodiments, substantially all of the outer surfaces of the system are antimicrobial surfaces. In some embodiments, the first antimicrobial surface may comprise an Active Screen Plasma alloyed layer. In some embodiments, the housing may comprise a molded polymer substrate and a metal coating layer bonded to the molded polymer substrate such that at least some exterior surfaces of the housing are metal coated surfaces.

Antimicrobial particle detectors

A method and system for attaching medical devices to a patient are provided. In accordance with an embodiment, a medical device is formed with or is coupled to an attachment structure including a plurality of electrodes capable of generating differential voltages at adjacent electrodes, to thereby provide electrostatic adhesion with the tissue of a patient. In an embodiment, the attachment structure includes an insulative material between the respective electrodes of the plurality of electrodes.

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Boulder, CO, United States of America

Scott MacLaughlin