Texas Instruments Corporation

Scott D Jantz

Thomas J Aton

Jerold A Seitchik

A flash waveform analyzer (10) includes a transmission line (12) for propagating a signal from an input (14). The transmission line (12) contains a plurality of samplers (16) located at different points along the transmission line (12). Each sampler (16) is activated by a strobe pulse from a strobe source (18) in order to measure a characteristic of the signal at the different points along the transmission line (12). The propagation velocity of the signal is made slower than the propagation velocity of the strobe pulse by using a different dielectric constant in the transmission line (12) than that of the strobe delay line (17). The characteristic measured by each sampler (16) is sent to a multiplexer (20) that selectively outputs the measured characteristic from each sampler (16) to an analog-to-digital converter (22) for processing and subsequent analysis.

Flash waveform analyzer method and device

An electrical power source or power cell (10) includes a semiconductor material (12) having an N region (14), a P region (16) and a P-N junction (18). A radioactive source (24) associates with P-N junction (18) and emits energy or radioactive particles (26) into semiconductor material (12). In semiconductor material (12), electron-hole pairs are formed in N region (14) and P region (16) to cause electrical current to pass through P-N junction (18) and produce, therefrom, electrical power.

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Jacksonville, FL, United States of America

Scott D Jantz