National Technology & Engineering Solutions of Sandia, LLC

Air Products and Chemicals, Inc.

Scott Alan Roberts

Matthew David Smith

Charles J Snider

Carianne Martinez

Kevin Matthew Potter

John P Korbin

Emily Donahue

Lincoln Collins

Joe Moore

Kevin Ferguson

Chris Schneller

Kathryn Whitaker

Stephen Islas

Jim Puissant

Digital image segmentation is provided. The method comprises training a neural network for image segmentation with a labeled training dataset from a first domain, wherein a subset of nodes in the neural net are dropped out during training. The neural network receives image data from a second, different domain. A vector of N values that sum to 1 is calculated for each image element, wherein each value represents an image segmentation class. A label is assigned to each image element according to the class with the highest value in the vector. Multiple inferences are performed with active dropout layers for each image element, and an uncertainty value is generated for each image element. Uncertainty is resolved according to expected characteristics. The label of any image element with an uncertainty above a threshold is replaced with a new label corresponding to a segmentation class based on domain knowledge.

Uncertainty-refined image segmentation under domain shift

A method for digital image segmentation is provided. The method comprises training a neural network for image segmentation with a labeled training dataset from a first domain, wherein a subset of nodes in the neural net are dropped out during training. The neural network receives image data from a second, different domain. A vector of N values that sum to 1 is calculated for each image element, wherein each value represents an image segmentation class. A label is assigned to each image element according to the class with the highest value in the vector. Multiple inferences are performed with active dropout layers for each image element, and an uncertainty value is generated for each image element. The label of any image element with an uncertainty value above a predefined threshold is replaced with a new label corresponding to the class with the next highest value.

Wafer carrier washing and drying apparatus and method, especially useful for the semiconducting industry.

Fixture drying apparatus and method

Growing community of inventors

Albuquerque, NM, United States of America

Scott Alan Roberts