Sony Semiconductor Solutions Corporation

Sony Corporation

Sayaka Shida

Masatsugu Kobayashi

Koki Mitsunami

Provided is a solid-state imaging device that includes a pixel array portion in which a plurality of pixels are arranged in a two-dimensional array, an AD conversion unit configured to perform AD conversion with respect to a pixel signal output from the pixel of the pixel array portion, a memory configured to retain a digital pixel signal after the AD conversion, and an image signal processing circuit configured to perform predetermined signal processing with respect to the digital pixel signal. The image signal processing circuit includes two or more PUs including one or more PEs configured to execute predetermined arithmetic processing, and a CU configured to operate the PE in an SIMD format, an IMEM configured to store one or more arithmetic processing instructions, and a CCU configured to control the PU.

Solid-state imaging device and signal processing method thereof, and electronic device

In an image sensor, high-speed recognition processing is performed using high-speed image data, which is different from low-speed image data used for displaying. In the image sensor, an imaging element captures an image of an object and generates frames of image data arranged in time series. A binarization processing unit performs binarization processing on each of the frames to generate binarized frames. A tracking processing unit generates a difference between binarized frames adjacent in time series and tracks a change in a position of the object included in the binarized frames.

Image sensor

The present technology relates to an image sensor, a processing method, and an electronic device for suppressing the deterioration of the quality of images captured by the image sensor. The image sensor includes a pixel array section configured to perform photoelectric conversion and have multiple pixels arrayed therein to output a pixel signal each; and a storage section configured to store the pixel signals output from the pixel array section. The image sensor writes and reads dummy data to and from the storage section in a non-access period other than the period in which the storage section is accessed for the writing and reading of the pixel signals thereto and therefrom. This technology may be applied to image sensors that capture images, for example.

Growing community of inventors

Kanagawa, Japan

Sayaka Shida