Cadence Design Systems, Inc.

Saurabh Kumar Tiwary

Joel Reuben Phillips

Igor Keller

Radu Zlatanovici

Hui Joyce Zhang

Hongzhou Liu

Christoph Albrecht

Claudio Pinello

Anubhav Gupta

In one embodiment of the invention, a method for designing an integrated circuit is disclosed. The method includes automatically partitioning clock sinks of an integrated circuit design into a plurality of partitions; automatically synthesizing a clock tree from a master clock generator into the plurality of partitions to minimize local clock skew within each of the plurality of partitions; and automatically synthesizing clock de-skew circuitry into each of the plurality of partitions to control clock skew between neighboring partitions.

Methods for designing intergrated circuits with automatically synthesized clock distribution networks

A system and method are disclosed for waveform based variational static timing analysis. A circuit is divided into its linear circuit parts and non-linear circuit parts and modeled together, by a combination of linear modeling techniques, into linear equations that may be represented by matrices. The linear equations in matrix form may be readily solved by a computer such that an input waveform to an input pin of the circuit can be sequentially 'pushed' through the various interconnects and logic networks of the circuit to an output pin. Output voltage waveforms are obtained at each stage of the waveform pushing and may be used to perform static timing analysis.

Waveform based variational static timing analysis

Methods and apparatus for waveform based variational static timing analysis

A method is provided to formally verify a property of a circuit design comprising: receiving a description of at least a portion of the circuit; receiving an indication of search accuracy criteria; receiving a description of a relationship between current and voltage (I-V relationship) for one or more of devices of the circuit; converting each I-V relationship to a conservative approximation of such I-V relationship; assigning voltage labels to one or more terminals of one or more identified devices that indicate voltage relationships among the one or more terminals consistent with KVL; defining a respective current relationship among one or more respective sets of currents of the one or more of the identified devices that is consistent with KCL; searching for one or more combinations of current and voltage values that are within at least one region of each conservative approximation and that are consistent with the voltage labels and that are consistent with each respective defined current relationship; converting each region determined to have a searched for combination of current and voltage values to multiple respective smaller regions; and repeating the acts of searching and converting until regions are obtained that meet the received search accuracy criteria.

Boolean satisfiability based verification of analog circuits

For an integrated circuit associated with a plurality of parameters whose values are described by a first probability distribution function, a method for estimating a failure probability includes selecting a first plurality of samples, performing a first test to determine an outcome for each of the first plurality of samples and identifying failed samples, and clustering the failed samples using a computer-implemented cluster forming method that, in some cases, returns multiple clusters. The method also includes forming a probability distribution function for each of the clusters, forming a composite probability distribution function that includes a weighted combination of the first probability distribution function and the probability distribution function for each of the clusters. The method further includes selecting a second plurality of samples using the composite probability distribution function and performing a second test to determine an outcome for each of the second plurality of samples. A failure probability can then be computed.

Methods and systems for high sigma yield estimation

Automatic synthesis of clock distribution networks

For an integrated circuit associated with a first plurality of parameters whose values are described by a first probability distribution function, a method for estimating a failure probability includes selecting a first plurality of samples, performing a first test to determine an outcome for each of the first plurality of samples and identifying failed samples. A second plurality of parameters is selected that has fewer parameters than the first plurality of parameters. The failed samples are clustered in the space of the second plurality of parameters using a computer-implemented cluster forming method that, in some cases, returns multiple clusters. The method also includes forming a probability distribution function for each of the clusters, forming a composite probability distribution function that includes a weighted combination of the first probability distribution function and the probability distribution function for each of the clusters. The method further includes selecting a second plurality of samples using the composite probability distribution function and performing a second test to determine an outcome for each of the second plurality of samples. A failure probability can then be computed.

Growing community of inventors

Berkeley, CA, United States of America

Saurabh Kumar Tiwary