Shimadzu Corporation

Osaka University

Omron Corporation

Satoshi Sano

Akira Horiba

Takahiro Doki

Taro Shirai

Kenji Kimura

Naoki Morimoto

Koichi Tanabe

Toshinori Yoshimuta

Yukihisa Wada

Hiroyuki Kishihara

Satoshi Tokuda

Shingo Furui

Heiji Watanabe

Takuji Hosoi

Takayoshi Shimura

Toshiyuki Sato

Takuro Izumi

Akihiro Nishimura

Heita Nada

Shuhei Yamada

Tomohiro Fujita

Masanobu Sato

Junichi Ohi

Hiroshi Mizushima

The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.

X-ray phase imaging apparatus and X-ray phase contrast image generation method

The X-ray imaging device () is provided with an X-ray source (), a plurality of gratings, a moving mechanism (), and an image processing unit (). The image processing unit () is configured to generate a phase-contrast image () by associating a pixel value in each pixel of a subject (T) in a plurality of subject images () with phase values of a Moire fringe () at each pixel and aligning the pixel of the subject of the same position in the plurality of subject images.

X-ray imaging device

In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.

X-ray phase imaging apparatus

The X-ray imaging device () is provided with an imaging system (CS) including an X-ray source (), a detector (), and a plurality of gratings, a moving mechanism (), a position information acquisition unit (), and an image processing unit () for generating a phase-contrast image () in a tomographic plane by acquiring a phase distribution in a tomographic plane () based on a plurality of X-ray images () and the acquired tomographic position (z+jd).

This X-ray phase imaging system () includes an X-ray source (), a detector (), a first grating group (), a second grating group (), a moving mechanism (), and an image processing unit (). The moving mechanism is configured to relatively move a subject (T) and the imaging system () such that the subject (T) passes through a first grating region (R) and a second grating region (R). The image processing unit is configured to generate a first phase-contrast image () and a second phase-contrast image ().

X-ray phase imaging system

An X-ray phase imaging method includes a step of correcting a gradation that occurred along an orthogonal direction to a translation direction as viewed from an optical axis direction of X-rays in a phase-contrast image based on a distribution state of the gradation.

X-ray phase imaging method

A radiation phase contrast imaging device includes an X-ray source, an X-ray detector configured to detect radiated X-rays, a plurality of gratings, an image processor configured to generate a reconstructed image from an X-ray image acquired from the X-ray detector, a display, and a controller configured or programmed to perform control to display, on the display, the X-ray image before reconstruction and the reconstructed image generated by the image processor.

Radiation phase contrast imaging device

This X-ray phase image capturing system () includes an X-ray source (), a plurality of gratings, and a detector (), a moving mechanism (), and an image processing unit (). The image processing unit () is configured to generate a phase-contrast image () based on a plurality of feature quantities () and feature quantitiesextracted from a plurality of X-ray image sets (R) acquired by performing fringe scanning a plurality of times in a short time.

X-ray phase image capturing system

In an X-ray imaging apparatus an image processor is configured to generate a phase contrast image based on a plurality of first images acquired by a first detection region (R) at a plurality of relative positions of the first detection region with respect to a subject (T) to be imaged, and to generate an absorption image based on a plurality of second images acquired by a second detection region (R) at a plurality of relative positions of the second detection region with respect to the subject.

X-ray imaging apparatus

This X-ray imaging apparatus () includes a rotation mechanism () for relatively rotating an imaging system () constituted by an X-ray source (), a detector (), a first grating () and a second grating (), and an image processing unit () for generating a dark-field image based on an X-ray intensity distribution at each of a plurality of rotation angles. The image processing unit () is configured to perform a scattering correction for reducing a dark-field signal of a pixel whose dark-field signal is larger than a threshold value (V) among a plurality of pieces of pixels in the dark-field image to a set value (V).

A phase contrast X-ray imaging system includes an X-ray source; a plurality of gratings; a detector; a grating movement mechanism; and an image processor that generates a phase contrast image. The image processor generates the phase contrast image by using a pitch of an intensity change and a function which has the pitch as a variable and expresses the intensity change in a pixel value as a grating moves.

Phase contrast X-ray imaging system

The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.

This X-ray phase difference imaging system () includes an X-ray source (), a plurality of gratings, a detector (), and an image processor (), in which the image processor () is configured to correct an artifact of a second phase contrast image () that is reconstructed by using a first X-ray image () and a third X-ray image (), on the basis of a first phase contrast image () that is reconstructed by using the first X-ray image () and a second X-ray image ().

X-ray phase difference imaging system and phase contrast image correction method

Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase gratingprovided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase gratingis observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase gratingand the absorption grating, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating, and the absorption gratingfrom the image of the reference area.

X-ray phase contrast imaging apparatus

The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction.

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Kyoto, Japan

Satoshi Sano