Adv Antest Corporation

Satoshi Kodera

Kunihiro Matsuura

Hironori Tanaka

Yasuhiro Urabe

Hiroki Ando

Takahiko Shimizu

Hiroki Andoh

A voltage source generates a power supply voltage Vstabilized such that it matches the voltage level that corresponds to a reference voltage V, and supplies the power supply voltage to a DUT. A current detection circuit generates a detection voltage Vm that corresponds to an output current Ithat flows through the DUT. In the initial state, the reference voltage Vgenerated by a reference voltage generating circuit is set to an initial voltage level that corresponds to an input voltage V. After the output current Iflows, the reference voltage transits to a first voltage level Vobtained by shifting the initial voltage level by a first voltage step that corresponds to the detection voltage Vm. Subsequently, the reference voltage Vtransits to a second voltage level VLobtained by shifting the initial voltage level by a second voltage step that corresponds to the detection voltage Vm.

Power supply apparatus for test apparatus

Provided is a measurement apparatus that measures a current flowing through a load, including a power supply section that outputs a current supplied to the load; a current measuring section that measures a load current flowing between the load and the power supply section; a switch that is connected in parallel with the current measuring section between the load and the power supply section; and a control section that disconnects the switch during measurement of the load current and connects the switch when the load current falls outside of a predetermined reference range.

Measurement apparatus, test apparatus and measurement method

There is provided a power amplifier circuit that applies an output voltage according to a given input voltage to a load, the power amplifier circuit includes an amplifying section of which an output port is connected to the load and that outputs the output voltage according to the input voltage, a source-side power source path that supplies an electric current output from the amplifying section via the output port to the amplifying section, a sink-side power source path that supplies an electric current drawn from the amplifying section via the output port to the amplifying section, a source-side capacitor that is connected between the output port of the amplifying section and the source-side power source path, and a sink-side capacitor that is connected between the output port of the amplifying section and the sink-side power source path.

Power amplifier circuit and test apparatus

There is provided a power-supply circuit for supplying voltage to a load, having a power supply that generates power-supply voltage, an inverted outputting circuit having a positive voltage terminal for outputting positive voltage based on the power-supply voltage and a negative voltage terminal for outputting negative voltage generated based on the power-supply voltage and having different polarity from the positive voltage and outputting the positive and negative voltage while keeping the same direction in terms of directions of electric current flowing between the positive voltage terminal and the outside and of electric current flowing between the negative voltage terminal and the outside, a step-down output circuit for outputting predetermined step-down output voltage to the outside by connecting the positive and negative voltage terminals to the outside while switching them with a predetermined duty ratio and a step-up output circuit for supplying step-up output voltage whose absolute value is greater than that of the step-down output voltage by switching whether or not to connect the step-down output circuit to the load with a predetermined duty ratio.

Power supply circuit, and testing apparatus

Power amplifier circuit outputs an output voltage corresponding to an input voltage supplied, and includes positive and negative-side output units including a positive or negative-side output resistor and a positive or negative-side transistor having its source terminal connected to one end of the positive or negative-side output resistor to make a current corresponding to a voltage supplied to its gate terminal flow to the positive or negative-side output resistor, positive and negative-side bias generating units which generate a positive or negative-side bias voltage corresponding to the input voltage, and positive and negative-side control units which control the voltage to be applied to the gate terminal of the positive or negative-side transistor such that the positive or negative-side bias voltage and source voltage of the positive or negative-side transistor become generally equal, and the voltage at connection node between the positive and negative-side output units is output as the output voltage.

A direct current measuring apparatus includes a voltage generating part generating a voltage to be applied to a load being a measuring object; a current limiting part limiting a current flowing in the load to a set value; and an output terminal connected to the load. The current limiting part includes a D/A converter, a positive side limiting circuit, a D/A converter and a negative side limiting circuit. The positive side limiting circuit includes a negative feedback loop. The negative feedback loop includes a capacitor and a buffer circuit besides the feedback resistance. An output of the positive side limiting circuit positive side limiting circuit is connected to a non-inverting input terminal of the main amplifier through a diode.

Direct current measuring apparatus and limiting circuit

A power-supply circuit for supplying voltage to a load while freely selecting positive voltage and negative voltage using a single power supply has a power supply that generates power-supply voltage, an inverted outputting circuit having a positive voltage terminal for outputting positive voltage based on the power-supply voltage and a negative voltage terminal for outputting negative voltage generated based on the power-supply voltage and having different polarity from the positive voltage and outputting the positive and negative voltage while keeping the same direction in terms of directions of electric current flowing between the positive voltage terminal and the outside and of electric current flowing between the negative voltage terminal and the outside and a step-down output circuit for supplying predetermined voltage to the load by connecting the positive voltage terminal and the negative voltage terminal to the load while switching them with a predetermined duty ratio.

Power supply circuit and test apparatus

There is provided a power source apparatus that includes a master circuit and a slave circuit provided in parallel and outputs an electric current that adds an electric current output from the master circuit and an electric current output from the slave circuit as a power-supply current. The master circuit includes: a main circuit side output section operable to output an electric current depending on a given voltage; a main circuit side reference power source operable to generate a reference voltage corresponding to a power-supply voltage that the power source apparatus is to output; and a main circuit side control section operable to supply the voltage corresponding to the reference voltage to the main circuit side output section in order to control the current output from the main circuit side output section. The slave circuit includes a sub-circuit side output section operable to receive a voltage based on the electric current output from the main circuit side output section and to output an electric current depending on the voltage, the sub-circuit side output section having the same characteristic as that of the main circuit side output section.

Power source apparatus

A power circuit which can reduce power consumption. More specifically, a testing apparatus for testing an electronic device which includes: a pattern generation unit for generating a test pattern which is supplied to the electronic device; a power supply circuit for supplying power to the electronic device; and a decision unit for deciding pass/fail of the electronic device based on an output signal output from the electronic device, wherein the power supply circuit has: a voltage source for generating a predetermined input voltage to be applied to the electronic device; a power device for supplying the power to the electronic device based on the input voltage generated by the voltage source; a power supply for supplying drive power of the power device; and a voltage control unit for controlling a drive voltage applied by the power supply to the power device based on the power output from the power device.

Test apparatus and power supply circuit

A testing apparatus includes a first power supply unit and first and second coaxial cables. The first power supply supplies current to a device under test. The first coaxial cable includes a first internal conductor and a first external conductor. The second coaxial cable includes a second internal conductor and a second external conductor. The first internal conductor and the second external conductor conducts current from the first power supply unit to the device under test. The second internal conductor and the first external conductor conducts current from the device under test to the first power supply unit.

Testing apparatus

A testing apparatus for testing a device under test, includes a power source for generating a current, a coaxial cable unit for supplying the current to the device under test, a detecting unit for detecting a voltage applied to the device under test when the current is supplied to the device under test and a judging unit for judging quality of the device under test based on the detected voltage, wherein the coaxial cable unit includes a first coaxial cable including a first internal conductor and a first external conductor, and a second coaxial cable including a second internal conductor and a second external conductor, wherein the first internal conductor and the second external conductor conduct a current from the power source towards the device under test, and the first external conductor and the second internal conductor conduct a current from the device under test towards the power source.

Growing community of inventors

Tokyo, Japan

Satoshi Kodera