Adv Antest Corporation

Jsr Corporation

Research Institute for Electromagnetic Materials

Satoshi Iwamoto

Koichi Yatsuka

Toshiyuki Okayasu

Masahiro Ishida

Takahiro Yamaguchi

Masakatsu Suda

Shin-ichiro Iwanaga

Masaru Tsuto

Masaru Goishi

Hiroyasu Nakayama

Tooru Kimura

Shigeki Takizawa

Koji Nishikawa

Nobukiyo Kobayashi

Kenji Ikeda

Motoo Ueda

Toshio Matsuura

Hiroko Nishimura

Yasutomo Ota

Shin-Ichiro Iwanaga

Provided are a magneto-optical material capable of enhancing the tunable range of magneto-optical properties such as the Faraday rotation angle, and a method for producing the same. The temperature of a substrateis controlled to a first temperature within the range of 300 to 800 [° C.], and the atmospheric pressure of the substrateis controlled to 1.0×10[Pa] or less (first step). Using a composite target or plurality of individual targets of a TCO material exhibiting ENZ properties in the infrared wavelength region, together with a magnetic metal, a magneto-optical materialis deposited on the substratewhile the temperature of the substrateis controlled to a second temperature within the range of 300 to 800 [° C.], and the atmospheric pressure of the substrateis controlled to the range of 0.1 to 10 [Pa] (second step).

Magneto-optical material and production method therefor

There is provided a test apparatus for testing a device under test, including a signal supply section that supplies a test signal to the device under test via a transmission line, and a comparing and judging section that receives a response signal from the device under test via the transmission line shared with the signal supply section, and judges whether the device under test is acceptable by referring to a comparison result obtained by comparing a signal level of the response signal with a reference level corresponding to a logic pattern of the test signal.

Test apparatus

Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; a synchronization module that is connected to each of the plurality of test modules, and that synchronizes the plurality of test modules; and a test control section that is connected to the plurality of test modules and the synchronization module, and that controls the test modules and the synchronization module. The synchronization module includes a receiving section that receives, from each of the plurality of test modules, a state signal indicating a state of the test module; an aggregating section that generates an aggregate state signal by calculating an aggregate of the state signals received by the receiving section; and a transmitting section that transmits, to the plurality of test modules, a control signal ordering an operation corresponding to the aggregate state signal.

Test apparatus synchronous module and synchronous method

A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test, the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.

Test apparatus additional module and test method

There is provided a test apparatus for testing a device under test, including a plurality of test modules that test the device under test, and a synchronization module that is connected to each of the plurality of test modules, where the synchronization module synchronizes together the plurality of test modules. Here, based on a synchronization signal received from a digital module, the synchronization module synchronizes an analog module to the digital module, and the digital module is one of the plurality of test modules that exchanges a digital signal with the device under test, and the analog module is one of the plurality of test modules that performs an analog test on the device under test.

Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module

There is provided a test apparatus for testing a device under test, including: a plurality of test sections; and a first synchronization section and a second synchronization section that, for each of a plurality of domains that respectively include one or more of the plurality of test sections, synchronize the one or more test sections included in the domain, where each of the first synchronization section and the second synchronization section includes: a local collection section that collects, for each domain, synchronization requests from the test sections connected to the corresponding synchronization section; an exchange section that exchanges, for a discrete domain of that includes test sections connected to the first synchronization section and test sections connected to the second synchronization section, synchronization requests collected in the corresponding synchronization section with synchronization requests collected in the other synchronization section; a global collection section that collects, the synchronization requests collected in the corresponding synchronization section and the synchronization requests collected in the other synchronization section; and a distribution section that distributes the collected synchronization requests to each of the test sections connected to the corresponding synchronization section.

Test apparatus and test method

Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern for testing the device under test; a signal supplying section that supplies the device under test with a test signal corresponding to the test pattern; a trigger generating section that supplies a trigger signal to an external instrument connected to the device under test; and a synchronization control section that outputs, to the trigger generating section, a synchronization signal instructing generation of the trigger signal, based on at least a portion of the test pattern generated by the pattern generating section.

Test equipment

A diagnostic program includes a first software module that diagnoses a diagnostic object test module; a plurality of second software modules respectively corresponding to the type of the non-diagnostic object test module, and controlling the non-diagnostic object test module to receive a signal for diagnosis output by the diagnostic object test module or to output a signal for diagnosis to the diagnostic object test module; a third software module specifying the second software module that corresponds to the type of the non-diagnostic object test module, in response to a call received from said first software module which instructs said third software module to receive the signal for diagnosis from or send the signal for diagnosis to the non-diagnostic object test module; and a fourth software module which calls the second software module specified by said third software module, and causes the signal for diagnosis to be input or output.

Diagnostic program, a switching program, a testing apparatus, and a diagnostic method

A test apparatus being capable of replacing a test module with the other kind of test module that tests device under tests by using the test module is provided. The test apparatus includes a plurality of test modules that transmit/receive signals to/from the device under tests to test the device under test; and a performance board for diagnosis that diagnose the plurality of test modules. The performance board for diagnosis including: a motherboard provided common to the plurality of test, modules; a circuit for diagnosis that transmits/receives a signal to/from each test module to diagnose the test module; a plurality of inter-board to module connectors that connect between the corresponding test module and the circuit for diagnosis; and

Test apparatus and performance board for diagnosis

A test apparatus that tests a device under test is provided. The test apparatus includes a test module that provides a test signal to the device under test. The test apparatus includes: a test module that provides a test signal to the device under test; a measuring instrument that measures a reference parameter including at least one of a reference voltage, a reference resistance and a reference current included in the test module; and a control device that controls the test module and the measuring instrument. By executing a diagnostic program that diagnose the plurality of test modules by using the measuring instruments, the control device to function as: a target diagnostic section that diagnoses a target test module; an acquirement section that acquires measuring instrument identification information indicative of the kind of the measuring instrument provided in the test apparatus; a measurement processing section provided for each kind of the measuring instruments and executed on the control device that issues a command to cause the measuring instrument to measure the value of the reference parameter of the test module to the measuring instrument and receives a measurement result of the reference parameter from the measuring instrument; and a switching section that calls the measurement processing section corresponding to the measuring instrument identified by the measuring instrument identification information in response to receiving the call to instruct to measure the value of a reference parameter included in the test module, executes the same and returns the measurement result of the reference parameter to the target diagnostic section.

Recording medium, test apparatus and diagnostic method

There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.

Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

There is provided a test apparatus having a plurality of test modules. The test apparatus stores object diagnosing programs for controlling diagnosis of the object test module to be diagnosed of a certain type per type of the test module to be diagnosed and stores, separately from it, a set of identification information of diagnostic performance board to be mounted on a test head to diagnose the object test module to be diagnosed by the respective object diagnosing programs per type of the object test modules to be diagnosed. When the diagnostic performance board is mounted on the test head, the test apparatus obtains identification information of the diagnostic performance board and executes the object diagnosing program corresponding to that type under the condition that the identification information coincides with the identification information stored correlatively with the type of the designated object test module to be diagnosed.

Test apparatus, diagnosing program and diagnosing method therefor

A radiation-sensitive resin composition comprising (A) an alkali-soluble resin having an unsaturated group, (B) a compound having at least one ethylenically unsaturated double bond, and (C) a radiation-induced radical polymerization initiator, wherein: The resin composition can form a radiation-sensitive film in a thickness greater than a deposit thickness and has a high resolution.

Radiation-sensitive resin composition

A driver circuit having a temperature correction circuit for producing an output signal with high precision amplitude and timing by correcting the temperature changes in the amplitude and timing. The temperature correction circuit includes a temperature detector for detecting the temperature change in output elements, a timing adjustment circuit for correcting the timing of an output signal relative to an input signal upon receiving the temperature detection signal from the temperature detector, and a bias circuit for correcting the output amplitude and impedance of the output signal.

Growing community of inventors

Tokyo, Japan

Satoshi Iwamoto