Nikon Corporation

Satoru Oshikawa

Hiroki Jinbo

Hiroyuki Hiraiwa

Tatsuo Niwa

In the measurement of internal transmittance of optical pieces, a standard is set for the piece for measuring the transmittance and a method of making the piece is provided. In the piece for measuring the Transmittance of optical materials having two opposing polished surfaces, their surface roughness rms is set to 10 .ANG. or less, thereby making it possible to accurately measure the internal transmittance in the short wavelength region of 300 nm or less where the intensity of the light source of spectrophotometer begins to decrease.

Method of making a piece of glass for measuring transmittance

In the measurement of internal transmittance of optical pieces, a standard is set for the piece for measuring the transmittance and a method of making the piece is provided. In the piece for measuring the transmittance of optical materials having two opposing polished surfaces, their surface roughness rms is set to 10 .ANG. or less, thereby making it possible to accurately measure the internal transmittance in the short wavelength region of 300 nm or less where the intensity of the light source of spectrophotometer begins to decrease.

A method for producing an electrochromic device, comprises the steps of:

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Yokohama, Japan

Satoru Oshikawa