General Electric Company

Baker Hughes Holdings LLC

Satheesh Jeyaraman

Baskaran Ganesan

Albrecht Maurer

Thomas James Batzinger

Yuri Alexeyevich Plotnikov

Bryon Edward Knight

Venkata Vijayaraghava Nalladega

Shyamsunder Tondanur Mandayam

Esha SenGupta

Esha Sen Gupta

Aibrecht Maurer

A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.

Method and system for determination of geometric features in objects

A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.

System and method for detecting defects in a component

Growing community of inventors

Karnataka, India

Satheesh Jeyaraman