Samsung Electronics Co., Ltd.

Sat Byul Kim

Il Gyu Kim

Chang Wook Jeong

Dae Sin Kim

Zhiliang Xia

Je Hyun Lee

Moon Hyun Cha

Min Chul Park

Sae Jin Kim

Ho Joon Lee

Sang Gul Park

Some example embodiments relate to a super resolution scanning electron microscope (SEM) image implementing device and/or a method thereof. Provided a super resolution scanning electron microscope (SEM) image implementing device comprising a processor configured to crop a low resolution SEM image to generate a first cropped image and a second cropped image, to upscale the first cropped image and the second cropped image to generate a first upscaled image and a second upscaled image, and to cancel noise from the first upscaled image and the second upscaled image to generate a first noise canceled image and a second noise canceled image.

Super resolution SEM image implementing device and method thereof

Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.

Grain analyzing method and system using HRTEM image

Growing community of inventors

Hwaseong-si, South Korea

Sat Byul Kim