Honeywell International Inc.

Sarabjit Singh

Frank Martin Haran

Michael Kon Yew Hughes

Johan Backstrom

Sharath Babu Malve

Stephane Savard

Shripad Kumar Pande

Chaitanya Kumar Beeram

Anthony F Digiulian

Anant Vitthal Vidwans

Iouri Markevitch

Supriya Rawat

Sharad Gitaram Pathare

Eduardo Gallestey Alvarez

Seshagiri Yamarthi

A method, apparatus and system for measuring a temperature can involve measuring a voltage with a resistance temperature detector using a variable excitation current, and deriving a process temperature from the voltage measured by the resistance temperature detector. The process temperature can be further derived by applying a plurality of values of the variable excitation current, measuring corresponding values of voltage, and estimating a resistance by applying a least square estimation. The process temperature can also be derived by applying a different value of the variable excitation current at every iteration, using a recursive least square estimation to measure a resistance, and using confidence intervals for instrument diagnostics.

Enhancing RTD measurement accuracy by means of variable excitation current

A method includes obtaining different measurements of voltages across terminals of a field device coupled to an I/O loop. The voltage measurements are associated with corresponding loop currents flowing through the I/O loop. The method also includes identifying a baseline loop resistance measurement of the I/O loop using the voltage measurements and the loop currents. The method further includes obtaining additional measurements of voltages across the terminals of the field device. The additional voltage measurements are associated with additional corresponding loop currents flowing through the I/O loop. The method also includes identifying additional loop resistance measurements of the I/O loop using the additional voltage measurements and the additional loop currents. In addition, the method includes detecting a problem with the I/O loop based on the baseline loop resistance measurement and the additional loop resistance measurements.

Detection of loop resistance and leakage current in input/output (I/O) loop

Method and apparatus for sustaining process temperature measurement with respect to a lead wire break. A resistance temperature device can include a group of lead wire arms including lead wire arms of a first lead wire type and a second lead wire type. An operation can occur to automatically switch from a first lead wire type configuration to a second lead wire type configuration in the resistance temperature device having the plurality of lead wire arms including the first lead wire type and the second lead wire type, if one or more wire breaks occurs in one or more the lead wire arms.

System and apparatus for sustaining process temperature measurement for RTD lead wire break

A method of level finding includes providing characteristics of a shape of a transmitted pulse in time domain launched onto a waveguide into a tank having at least one material therein, physical properties of the waveguide and real and imaginary dielectric characteristics of the material at a frequency of the pulse. A level finding algorithm having a coarse search and a fine search is implemented, where the coarse search minimizes a prediction error between an echo signal (echo curve y(k)) and a sampled pulse model echo p(k) to obtain an objective function J(k) in a vicinity of a minimum prediction error (k*). The fine search calculates at least one minimum or maximum using J(k) in the vicinity of k*. The minimum or the maximum corresponds to a level of the material or an interface involving the material.

Level finding using multiple search steps

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Hyderabad Telangana, India

Sarabjit Singh