Lawrence Livermore National Security, LLC

Michigan State University

Saptarshi Mukherjee

Tammy Chang

Joseph W Tringe

Lalita Udpa

Satish Udpa

The present disclosure relates to a volumetric additive manufacturing system for forming a structure from a volume of resin using microwave energy. The system makes use of an electronic controller and at least one beam forming algorithm accessible by the electronic controller for generating information relating to an amplitude and a time delay for forming a microwave signal, where the microwave signal will be used in irradiating a build volume, and where the build volume is formed by the volume of resin. A microwave signal generating subsystem is included which is responsive to the information generated by the beam forming algorithm, and which generates a microwave signal using the amplitude and the time delay determined by the beam forming algorithm. An antenna is used to receive the microwave signal and project the microwave signal as a microwave beam, in accordance with the amplitude and time delay, into the build volume to form the structure.

System and method for microwave volumetric additive manufacturing

The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.

System and method for sub-wavelength detection for jetting-based additive manufacturing using a split ring resonator probe

A defect sensing apparatus is configured to identify defects or targets in materials. A further aspect of the defect sensing apparatus includes a reference split-ring resonator coupled to the microstrip. The defect sensing apparatus includes a reference split-ring resonator located on a reference side of the microstrip and a first sensing split-ring resonator located on a sensing side of the microstrip.

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Milpitas, CA, United States of America

Saptarshi Mukherjee