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Santa Clara, CA, United States of America

Santhosh K Vanaparthy

Average Co-Inventor Count = 2.58

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 16

Santhosh K VanaparthyRavi H Motwani (12 patents)Santhosh K VanaparthyPoovaiah Manavattira Palangappa (5 patents)Santhosh K VanaparthyZion S Kwok (4 patents)Santhosh K VanaparthyAman Bhatia (2 patents)Santhosh K VanaparthyRainer Strobel (1 patent)Santhosh K VanaparthyDebarnab Mitra (1 patent)Santhosh K VanaparthyJustin Kang (1 patent)Santhosh K VanaparthySantosh Emmadi (1 patent)Santhosh K VanaparthySanthosh K Vanaparthy (15 patents)Ravi H MotwaniRavi H Motwani (60 patents)Poovaiah Manavattira PalangappaPoovaiah Manavattira Palangappa (11 patents)Zion S KwokZion S Kwok (49 patents)Aman BhatiaAman Bhatia (115 patents)Rainer StrobelRainer Strobel (56 patents)Debarnab MitraDebarnab Mitra (2 patents)Justin KangJustin Kang (1 patent)Santosh EmmadiSantosh Emmadi (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Intel Corporation (15 from 54,750 patents)


15 patents:

1. 12504912 - Soft read for NVM that is subject to destructive reads

2. 12176918 - Hybrid LDPC decoder with mixed precision components

3. 12113547 - Application of low-density parity-check codes with codeword segmentation

4. 12032725 - Data scrambler for persistent memory

5. 11876622 - LDPC encoder and decoder for multi-mode higher speed passive optical networks

6. 11777530 - Methods and apparatuses for generating optimized LDPC codes

7. 11515891 - Application of low-density parity-check codes with codeword segmentation

8. 11182240 - Techniques to improve error correction using an XOR rebuild scheme of multiple codewords and prevent miscorrection from read reference voltage shifts

9. 11159175 - Non-uniform iteration-dependent min-sum scaling factors for improved performance of spatially-coupled LDPC codes

10. 11146289 - Techniques to use intrinsic information for a bit-flipping error correction control decoder

11. 10944428 - Device, system and method for determining bit reliability information

12. 10707901 - Die-wise residual bit error rate (RBER) estimation for memories

13. 10621035 - Techniques for correcting data errors in memory devices

14. 10579473 - Mitigating silent data corruption in error control coding

15. 10481974 - Apparatus, non-volatile memory storage device and method for detecting drift in non-volatile memory

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12/28/2025
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