Western Digital Technologies, Inc.

Hgst Netherlands, B.v.

Sanoj Kizhakkekara Unnikrishnan

Anand Mitra

Kanishk Rastogi

Embodiments of the present disclosure provide a memory-efficient mechanism for identifying memory blocks with a low wear count. More particularly, embodiments of the present disclosure provide a mechanism for identifying a memory block whose wear count is within the bottom p % of all wear counts associated with memory blocks in a storage system. If a memory controller performs the garbage collection operation on a memory block whose wear count is within the bottom p % of all wear counts, then the memory controller is expected to utilize the remaining memory blocks (e.g., memory blocks whose wear count is within the upper (100-p) % of all wear counts) efficiently and level the wear count of at least the remaining memory blocks.

Wear leveling in solid state devices

Embodiments of the present disclosure provide a memory-efficient mechanism for identifying memory blocks with a low wear count. More particularly, embodiments of the present disclosure provide a mechanism for identifying a memory block whose wear count is within the bottom p % of all wear counts associated with memory blocks in a storage system. If a memory controller performs the garbage collection operation on a memory block whose wear count is within the bottom p % of all wear counts, then the memory controller is expected to utilize the remaining memory blocks (e.g., memory blocks whose wear count is within the upper (100&#x2212;p) % of all wear counts) efficiently and level the wear count of at least the remaining memory blocks.

Embodiments of the present disclosure provide a memory-efficient mechanism for identifying memory blocks with a low wear count. More particularly, embodiments of the present disclosure provide a mechanism for identifying a memory block whose wear count is within the bottom p % of all wear counts associated with memory blocks in a storage system. If a memory controller always performs the garbage collection operation on a memory block whose wear count is within the bottom p % of all wear counts, then the memory controller is expected to utilize the remaining memory blocks (e.g., memory blocks whose wear count is within the upper (100-p) % of all wear counts) efficiently and level the wear count of at least the remaining memory blocks.

Embodiments of the present disclosure provides a memory-efficient mechanism for identifying memory blocks with a low wear count. More particularly, embodiments of the present disclosure provides a mechanism for identifying a memory block whose wear count is within the bottom p % of all wear counts associated with memory blocks in a storage system. If a memory controller always performs the garbage collection operation on a memory block whose wear count is within the bottom p % of all wear counts, then the memory controller is expected to utilize the remaining memory blocks (e.g., memory blocks whose wear count is within the upper (100&#x2212;p) % of all wear counts) efficiently and level the wear count of at least the remaining memory blocks.

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Bengaluru, India

Sanoj Kizhakkekara Unnikrishnan