Iowa State University Research Foundation, Inc.

University of California

Sanjeevi Sivasankar

Hui Li

Armand Paul Alivisatos

Charina L Choi

Chi-Fu Yen

Kristie J Koski

We describe a new technique, standing wave axial nanometry (SWAN), to image the axial location of a single nanoscale fluorescent object with sub-nanometer accuracy and 3.7 nm precision. A standing wave, generated by positing an atomic force microscope tip over a focused laser beam, is used to excite fluorescence; axial position is determined from the phase of the mission intensity.

Fluorescence axial localization with nanometer accuracy and precision

An apparatus, system, and method of integrating atomic force microscopy (AFM) and fluorescence microscopy (FM). One particular application is to simultaneous single molecular fluorescence with AFM force spectroscopy. Included is a methodology to align the AFM tip and a molecule or other nanoscale object with high accuracy.

System, apparatus, and method for simultaneous single molecule atomic force microscopy and fluorescence measurements

Systems and methods of detecting force on the nanoscale including methods for detecting force using a tetrapod nanocrystal by exposing the tetrapod nanocrystal to light, which produces a luminescent response by the tetrapod nanocrystal. The method continues with detecting a difference in the luminescent response by the tetrapod nanocrystal relative to a base luminescent response that indicates a force between a first and second medium or stresses or strains experienced within a material. Such systems and methods find use with biological systems to measure forces in biological events or interactions.

Growing community of inventors

Ames, IA, United States of America

Sanjeevi Sivasankar